Scaling Down Candidate Sets Based on the Temporal Feature of Items for Improved Hybrid Recommendations

2005 ◽  
pp. 169-186 ◽  
Author(s):  
Tiffany Ya Tang ◽  
Pinata Winoto ◽  
Keith C. C. Chan
Keyword(s):  
Scaling Down ◽  
Temporal Feature

Chaplaincies in a “Post-Secular” Multicultural University

2015 ◽  
Vol 9 (2) ◽  
pp. 147-165 ◽  
Author(s):  
Adam Possamai ◽  
Arathi Sriprakash ◽  
Ellen Brackenreg ◽  
John McGuire
Keyword(s):  
Public Institutions ◽  
Religion And Spirituality ◽  
Scaling Down ◽  
The University

As universities in Australia are faced with a growth in diversity and intensity of religion and spirituality on campus, this article explores the work of chaplains and its reception by students on a multi-campus suburban university. It finds that the religious work of these professionals is not the primary emphasis in the university context; what is of greater significance to students and the university institution is the broader pastoral and welfare-support role of chaplains. We discuss these findings in relation to post-secularism theory and the scaling down of state-provided welfare in public institutions such as universities.

Application of AFP Nanoprobing Light-Induced Photovoltaic Current in the Failure Analysis

2017 ◽  
Author(s):  
C.Q. Chen ◽  
P.T. Ng ◽  
G.B. Ang ◽  
Francis Rivai ◽  
S.L. Ting ◽  
...  
Keyword(s):  
Image Analysis ◽  
Failure Analysis ◽  
Photovoltaic Effect ◽  
Electrical Characterization ◽  
Fault Isolation ◽  
Device Performance ◽  
Semiconductor Technology ◽  
Current Image ◽  
Scaling Down ◽  
Detailed Circuit

Abstract As semiconductor technology keeps scaling down, failure analysis and device characterizations become more and more challenging. Global fault isolation without detailed circuit information comprises the majority of foundry EFA cases. Certain suspected areas can be isolated, but further narrow-down of transistor and device performance is very important with regards to process monitoring and failure analysis. A nanoprobing methodology is widely applied in advanced failure analysis, especially during device level electrical characterization. It is useful to verify device performance and to prove the problematic structure electrically. But sometimes the EFA spot coverage is too big to do nanoprobing analysis. Then further narrow-down is quite critical to identify the suspected structure before nanoprobing is employed. That means there is a gap between global fault isolation and localized device analysis. Under these kinds of situation, PVC and AFP current image are offen options to identify the suspected structure, but they still have their limitation for many soft defect or marginal fails. As in this case, PVC and AFP current image failed to identify the defect in the spot range. To overcome the shortage of PVC and AFP current image analysis, laser was innovatively applied in our current image analysis in this paper. As is known to all, proper wavelength laser can induce the photovoltaic effect in the device. The photovoltaic effect induced photo current can bring with it some information of the device. If this kind of information was properly interpreted, it can give us some clue of the device performance.

Extracting Spatio-temporal Feature for Classification of Event-related Potentials*

2011 ◽  
Vol 38 (9) ◽  
pp. 866-871 ◽  
Author(s):  
Zhi-Hua HUANG ◽  
Ming-Hong LI ◽  
Yuan-Ye MA ◽  
Chang-Le ZHOU
Keyword(s):  
Event Related Potentials ◽  
Related Potentials ◽  
Spatio Temporal ◽  
Temporal Feature

scholarly journals RTFN: A Robust Temporal Feature Network for Time Series Classification

2021 ◽  
Author(s):  
Zhiwen Xiao ◽  
Xin Xu ◽  
Huanlai Xing ◽  
Shouxi Luo ◽  
Penglin Dai ◽  
...  
Keyword(s):  
Time Series ◽  
Time Series Classification ◽  
Temporal Feature

scholarly journals Multi-Path and Group-Loss-Based Network for Speech Emotion Recognition in Multi-Domain Datasets

Sensors ◽  
2021 ◽  
Vol 21 (5) ◽  
pp. 1579 ◽  
Author(s):  
Kyoung Ju Noh ◽  
Chi Yoon Jeong ◽  
Jiyoun Lim ◽  
Seungeun Chung ◽  
Gague Kim ◽  
...  
Keyword(s):  
Emotion Recognition ◽  
Short Term Memory ◽  
Domain Adaptation ◽  
Classification Model ◽  
Speech Emotion Recognition ◽  
Target Domain ◽  
Model Generalization ◽  
Speech Database ◽  
Emotion Labels ◽  
Temporal Feature

Speech emotion recognition (SER) is a natural method of recognizing individual emotions in everyday life. To distribute SER models to real-world applications, some key challenges must be overcome, such as the lack of datasets tagged with emotion labels and the weak generalization of the SER model for an unseen target domain. This study proposes a multi-path and group-loss-based network (MPGLN) for SER to support multi-domain adaptation. The proposed model includes a bidirectional long short-term memory-based temporal feature generator and a transferred feature extractor from the pre-trained VGG-like audio classification model (VGGish), and it learns simultaneously based on multiple losses according to the association of emotion labels in the discrete and dimensional models. For the evaluation of the MPGLN SER as applied to multi-cultural domain datasets, the Korean Emotional Speech Database (KESD), including KESDy18 and KESDy19, is constructed, and the English-speaking Interactive Emotional Dyadic Motion Capture database (IEMOCAP) is used. The evaluation of multi-domain adaptation and domain generalization showed 3.7% and 3.5% improvements, respectively, of the F1 score when comparing the performance of MPGLN SER with a baseline SER model that uses a temporal feature generator. We show that the MPGLN SER efficiently supports multi-domain adaptation and reinforces model generalization.

scholarly journals Selected Aspects of Electrochemical Micromachining Technology Development

Materials ◽  
2021 ◽  
Vol 14 (9) ◽  
pp. 2248
Author(s):  
Sebastian Skoczypiec ◽  
Piotr Lipiec ◽  
Wojciech Bizoń ◽  
Dominik Wyszyński
Keyword(s):  
Technology Development ◽  
Electrochemical Machining ◽  
Electrochemical Micromachining ◽  
Cylindrical Electrode ◽  
Electrode Tool ◽  
Geometrical Features ◽  
Tool Trajectory ◽  
Scaling Down ◽  
Sidewall Surface ◽  
Selection Of

The paper focuses on the fundamentals of electrochemical machining technology de-elopement with special attention to applications for micromachining. In this method, a material is removed during an anodic electrochemical dissolution. The method has a number of features which make it attractive technology for shaping parts with geometrical features in range of micrometres. The paper is divided into two parts. The first one covers discussion on: general characteristics of electrochemical machining, phenomena in the gap, problems resulting from scaling down the process and electrochemical micromachining processes and variants. The second part consists of synthetic overview of the authors’ research on localization of pulse electrochemical micromachining process and case studies connected with application of this method with use of universal cylindrical electrode-tool for shaping cavities in 1.4301 stainless steel. The latter application was conducted in two following variants: electrochemical contour milling and shaping carried out with sidewall surface of rotating tool. In both cases, the obtained shape is a function of electrode tool trajectory. Selection of adequate machining strategy allows to obtain desired shape and quality.

Sign in / Sign up

Export Citation Format

Share Document