Charge Traps in High-k Dielectrics: Ab Initio Study of Defects in Pr-Based Materials
1998 ◽
Vol 184-185
(1-2)
◽
pp. 80-84
◽
Keyword(s):
1987 ◽
Vol 52
(1)
◽
pp. 6-13
◽
2007 ◽
Vol 78
(1)
◽
pp. 13001
◽