Profile Imaging of Silicon Surface Reconstructions

1985 ◽  
Vol 43 ◽  
pp. 262-263
Author(s):  
O.L. Krivanek ◽  
G.J. Wood
Keyword(s):  
Electron Microscopy ◽  
Surface Structure ◽  
Structure Determination ◽  
Silicon Surface ◽  
Good Resolution ◽  
Surface Reconstructions ◽  
Bulk Structure ◽  
Point To Point ◽  
The Relationship

Electron microscopy at 0.2nm point-to-point resolution, 10-10 torr specimei region vacuum and facilities for in-situ specimen cleaning presents intere; ing possibilities for surface structure determination. Three methods for examining the surfaces are available: reflection (REM), transmission (TEM) and profile imaging. Profile imaging is particularly useful because it giv good resolution perpendicular as well as parallel to the surface, and can therefore be used to determine the relationship between the surface and the bulk structure.

scholarly journals Direct Surface Structure Determination with Photoelectron Diffraction

1983 ◽  
Vol 51 (4) ◽  
pp. 272-275 ◽  
Author(s):  
J. J. Barton ◽  
C. C. Bahr ◽  
Z. Hussain ◽  
S. W. Robey ◽  
J. G. Tobin ◽  
...  
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
Photoelectron Diffraction

Structure Determination of the Nisi2(111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

1990 ◽  
Vol 202 ◽  
Author(s):  
J. Vrijmoeth ◽  
P.M. Zagwijn ◽  
J.W.M. Frenken ◽  
J.F. van der Veen
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
New Method ◽  
Medium Energy ◽  
Ion Scattering ◽  
Triple Layer ◽  
Medium Energy Ion Scattering

ABSTRACTThe surface structure of epitaxial NiSi2 films grown on Si (111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the NiSi2 (111) surface are resolved.The topology of the NiSi2 (111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.

Tensor LEED: A Technique for High-Speed Surface-Structure Determination

1986 ◽  
Vol 57 (23) ◽  
pp. 2951-2954 ◽  
Author(s):  
P. J. Rous ◽  
J. B. Pendry ◽  
D. K. Saldin ◽  
K. Heinz ◽  
K. Müller ◽  
...  
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
High Speed

A simple X-ray standing wave technique for surface structure determination - theory and an application

1988 ◽  
Vol 195 (1-2) ◽  
pp. 237-254 ◽  
Author(s):  
D.P. Woodruff ◽  
D.L. Seymour ◽  
C.F. McConville ◽  
C.E. Riley ◽  
M.D. Crapper ◽  
...  
Keyword(s):  
Surface Structure ◽  
Standing Wave ◽  
Structure Determination ◽  
X Ray ◽  
Wave Technique
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