Lateral Force Microscopy Study of the Friction between Silica Surfaces

2000 ◽  
Vol 232 (1) ◽  
pp. 133-140 ◽  
Author(s):  
Simon Biggs ◽  
Robert Cain ◽  
Neil W. Page
Keyword(s):  
Lateral Force ◽  
Microscopy Study ◽  
Lateral Force Microscopy ◽  
Force Microscopy ◽  
Silica Surfaces

A lateral force microscopy study of friction between glassy carbon and different surfaces

2004 ◽  
Vol 36 (8) ◽  
pp. 1246-1249 ◽  
Author(s):  
S. Stiess ◽  
A. Richter ◽  
B. V. King ◽  
M. Reitsma ◽  
R. Smith
Keyword(s):  
Glassy Carbon ◽  
Lateral Force ◽  
Microscopy Study ◽  
Lateral Force Microscopy ◽  
Force Microscopy

Quantitative Lateral Force Microscopy Study of the Dolomite (104)−Water Interface

Langmuir ◽  
2007 ◽  
Vol 23 (17) ◽  
pp. 8909-8915 ◽  
Author(s):  
Steven R. Higgins ◽  
Xiaoming Hu ◽  
Paul Fenter
Keyword(s):  
Lateral Force ◽  
Microscopy Study ◽  
Water Interface ◽  
Lateral Force Microscopy ◽  
Force Microscopy

Sliding Friction by Atomic Force Microscopy

1998 ◽  
Vol 543 ◽  
Author(s):  
V. Pasquier ◽  
J. M. Drake
Keyword(s):  
Atomic Force Microscopy ◽  
Sliding Friction ◽  
Lateral Force ◽  
Lateral Force Microscopy ◽  
Force Microscopy ◽  
Load Dependence ◽  
Silica Surfaces ◽  
Atomic Force ◽  
Friction Measurements ◽  
Force Calibration

AbstractLateral Force Microscopy offers the possibility of exploring tribological properties of interfaces atthe nanoscale. Our research focused on some crucial conditions that must be fuffilled to obtainquantitative and reliable LFM friction measurements. We have characterized the mechanical andvibrational properties of the cantilever. Precise force calibration were made based on ourknowledge of the intrinsic coupling modes of the cantilever. We report measurements of the slidingfriction between two silica surfaces. The load dependence of the friction force was analyzedassuming different models for the contact, from Hertzian to Amontons law.

Lateral force microscopy study of functionalized self-assembled monolayer surfaces

1999 ◽  
Vol 341 (1-2) ◽  
pp. 91-93 ◽  
Author(s):  
Yun Kim ◽  
Kwang-Salk Kim ◽  
Mingyu Park ◽  
Jaein Jeong
Keyword(s):  
Lateral Force ◽  
Microscopy Study ◽  
Lateral Force Microscopy ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Self Assembled
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