Crystal Structure of LiRh-type IrZn Determined by Powder X-ray and Selected Area Electron Diffraction

2020 ◽  
Vol 646 (8) ◽  
pp. 407-411
Author(s):  
Wolfgang Hornfeck ◽  
Viola Duppel ◽  
Lorenz Kienle ◽  
Bernd Harbrecht
Keyword(s):  
Crystal Structure ◽  
Electron Diffraction ◽  
X Ray ◽  
Selected Area Electron Diffraction

Structure and electrical properties of tetragonal tungsten bronze Ba2CeFeNb4O15

RSC Advances ◽  
2015 ◽  
Vol 5 (94) ◽  
pp. 76957-76962 ◽  
Author(s):  
Hongqiang Ma ◽  
Kun Lin ◽  
Laijun Liu ◽  
Baoling Yang ◽  
Yangchun Rong ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Electrical Property ◽  
Electrical Properties ◽  
Impedance Spectroscopy ◽  
Electron Diffraction ◽  
Tungsten Bronze ◽  
Ac Impedance Spectroscopy ◽  
Tetragonal Tungsten Bronze ◽  
X Ray ◽  
Selected Area Electron Diffraction

The crystal structure and electrical property of a tetragonal tungsten bronze ceramic, BaCeFeNb4O15, were investigated by synchrotron X-ray powder diffraction, selected area electron diffraction, and AC impedance spectroscopy.

HRTEM Observation of Rod-Shape Precipitates in Al-Mg-Si-Ag Alloy Aged at 523 K

2007 ◽  
Vol 561-565 ◽  
pp. 243-246 ◽  
Author(s):  
Junya Nakamura ◽  
Kenji Matsuda ◽  
Yoshio Nakamura ◽  
Tatsuo Sato ◽  
Susumu Ikeno
Keyword(s):  
Crystal Structure ◽  
Electron Microscope ◽  
High Resolution ◽  
Electron Diffraction ◽  
Metastable Phase ◽  
X Ray ◽  
Β Phase ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
Hrtem Observation

The purpose of this study is to identify the crystal structure of metastable phase in Ag added Al-Mg-Si alloy to compare the formation of β’-phases in Al-Mg-Si alloys without Ag, using images of high resolution transmission electron microscope (HRTEM), selected area electron diffraction (SAED) patterns and an energy dispersive X-ray spectroscopy (EDS). The result of SAED patterns and HRTEM images have been simulated and compared with images then SAED patterns obtained from actual precipitates. SAED patterns and HRTEM images obtained from metastable phase in the Ag added Al-Mg-Si alloy showed similar to those of β’-phase in Al-Mg-Si alloy without Ag and the lattice spacings changed because of the effect of Ag.

Crystal structure and stacking faults of myristyl stearate identified by electron diffraction

1989 ◽  
Vol 47 ◽  
pp. 662-663
Author(s):  
W.P. Zhang ◽  
D.L. Dorset ◽  
J. Hanlon
Keyword(s):  
Crystal Structure ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Crystal Structures ◽  
Fourier Transforms ◽  
Stacking Faults ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Diffraction Patterns ◽  
Long Chain

Although a few X-ray crystal structures of normal-chain esters of long chain acids and short chain alcohols have been carried out, attention has been paid mostly to the long-spacings of waxes synthesized from longer chain alcohols. We have been interested in exploring the crystal structures of the more symmetric waxes via electron diffraction studies.Myristyl stearate thin crystals were epitaxially grown on benzoic acid by the method developed by Wittmann et al. Some samples with or without the presence of the nucleating substrates were annealed at 45°C for 4 hours on a Met tier FP82 hot stage. The thin crystals before or after annealing were examined with a JEOL JEM-100CX electron microscope operated at 100 kV, and selected area electron diffraction patterns from [100] and [110] directions were recorded on Kodak DEF-5 X-ray film. The calibration of the camera length was carried out with a gold Debye-Scherrer diagram. Models of molecular packing were scanned with an Optronics P-1000, and their Fourier transforms were calculated with a program in IMAGIC.

Bimolecular and Monomolecular Lipid Films: Selected Area Electron Diffraction

1969 ◽  
Vol 27 ◽  
pp. 338-339
Author(s):  
Robert M. Glaeser ◽  
David W. Deamer
Keyword(s):  
Electron Diffraction ◽  
Membrane Structure ◽  
Molecular Organization ◽  
Membrane Material ◽  
X Ray Diffraction ◽  
Membrane Systems ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Lipid Films ◽  
Ultimate Objective

In the investigation of the molecular organization of cell membranes it is often supposed that lipid molecules are arranged in a bimolecular film. X-ray diffraction data obtained in a direction perpendicular to the plane of suitably layered membrane systems have generally been interpreted in accord with such a model of the membrane structure. The present studies were begun in order to determine whether selected area electron diffraction would provide a tool of sufficient sensitivity to permit investigation of the degree of intermolecular order within lipid films. The ultimate objective would then be to apply the method to single fragments of cell membrane material in order to obtain data complementary to the transverse data obtainable by x-ray diffraction.

The structure of amorphous and polycrystalline materials using energy-filtered RDF analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1190-1191
Author(s):  
David Cockayne ◽  
David McKenzie
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Density Function ◽  
Electron Diffraction Pattern ◽  
Polycrystalline Materials ◽  
Nearest Neighbour ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Reduced Density ◽  
System F

The technique of Electron Reduced Density Function (RDF) analysis has ben developed into a rapid analytical tool for the analysis of small volumes of amorphous or polycrystalline materials. The energy filtered electron diffraction pattern is collected to high scattering angles (currendy to s = 2 sinθ/λ = 6.5 Å-1) by scanning the selected area electron diffraction pattern across the entrance aperture to a GATAN parallel energy loss spectrometer. The diffraction pattern is then converted to a reduced density function, G(r), using mathematical procedures equivalent to those used in X-ray and neutron diffraction studies.Nearest neighbour distances accurate to 0.01 Å are obtained routinely, and bond distortions of molecules can be determined from the ratio of first to second nearest neighbour distances. The accuracy of coordination number determinations from polycrystalline monatomic materials (eg Pt) is high (5%). In amorphous systems (eg carbon, silicon) it is reasonable (10%), but in multi-element systems there are a number of problems to be overcome; to reduce the diffraction pattern to G(r), the approximation must be made that for all elements i,j in the system, fj(s) = Kji fi,(s) where Kji is independent of s.

Dynamic low-dose electron diffraction and imaging of phase transitions in polymers

1993 ◽  
Vol 51 ◽  
pp. 890-891
Author(s):  
David C. Martin ◽  
Jun Liao
Keyword(s):  
Crystal Structure ◽  
Phase Transition ◽  
Electron Diffraction ◽  
Low Dose ◽  
Dark Field ◽  
Continuous Change ◽  
Selected Area Electron Diffraction ◽  
Resolution Electron ◽  
Chain Axis ◽  
High Resolution Electron Micrographs

By careful control of the electron beam it is possible to simultaneously induce and observe the phase transformation from monomer to polymer in certain solid-state polymcrizable diacetylenes. The continuous change in the crystal structure from DCHD diacetylene monomer (a=1.76 nm, b=1.36 nm, c=0.455 nm, γ=94 degrees, P2l/c) to polymer (a=1.74 nm, b=1.29 nm, c=0.49 nm, γ=108 degrees, P2l/c) occurs at a characteristic dose (10−4C/cm2) which is five orders of magnitude smaller than the critical end point dose (20 C/cm2). Previously we discussed the progress of this phase transition primarily as observed down the [001] zone (the chain axis direction). Here we report on the associated changes of the dark field (DF) images and selected area electron diffraction (SAED) patterns of the crystals as observed from the side (i.e., in the [hk0] zones).High resolution electron micrographs (HREM), DF images, and SAED patterns were obtained on a JEOL 4000 EX HREM operating at 400 kV.

Assessment of the U3O7 Crystal Structure by X-ray and Electron Diffraction

2016 ◽  
Vol 55 (19) ◽  
pp. 9923-9936 ◽  
Author(s):  
Gregory Leinders ◽  
Rémi Delville ◽  
Janne Pakarinen ◽  
Thomas Cardinaels ◽  
Koen Binnemans ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Electron Diffraction ◽  
X Ray

HRTEM Investigation of Precipitates in Al-Zn-In-Mg-Ti-Ce Anode Alloy

2011 ◽  
Vol 189-193 ◽  
pp. 1036-1039
Author(s):  
Jing Ling Ma ◽  
Jiu Ba Wen ◽  
Yan Fu Yan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Hexagonal Structure ◽  
Orientation Relation ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
Scanning Electron

The precipitates of Al-5Zn-0.02In-1Mg-0.05Ti-0.5Ce (wt %) anode alloy were studied by scanning electron microscopy, X-ray microanalysis, high resolution transmission electron microscopy and selected area electron diffraction analyses in the present work. The results show that the alloy mainly contains hexagonal structure MgZn2 and tetragonal structure Al2CeZn2 precipitates. From high resolution transmission electron microscopy and selected area electron diffraction, aluminium, Al2CeZn2 and MgZn2 phases have [0 1 -1]Al|| [1 -10]Al2CeZn2|| [-1 1 0 1]MgZn2orientation relation, and Al2CeZn2 and MgZn2 phases have the [0 2 -1]Al2CeZn2|| [0 1 -10]MgZn2orientation relation.

Comparison of Simulated and Experimental Order Parameters in FePt—II

2011 ◽  
Vol 17 (3) ◽  
pp. 403-409 ◽  
Author(s):  
Karen L. Torres ◽  
Richard R. Vanfleet ◽  
Gregory B. Thompson
Keyword(s):  
Electron Diffraction ◽  
Order Parameter ◽  
Convergent Beam Electron Diffraction ◽  
Order Parameters ◽  
X Ray Diffraction ◽  
Chemical Order ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Convergent Beam ◽  
Good Agreement

AbstractEight FePt thin film specimens of various thicknesses, compositions, and order parameters have been analyzed to determine the robustness and fidelity of multislice simulations in determining the chemical order parameter via electron diffraction (ED). The shape of the simulated curves depends significantly on the orientation and thickness of the specimen. The ED results are compared to kinematical scattering order parameters, from the same films, acquired from synchrotron X-ray diffraction (XRD). For the specimens analyzed with convergent beam electron diffraction conditions, the order parameter closely matched the order parameter as determined by the XRD methodology. However, the specimens analyzed by selected area electron diffraction conditions did not show good agreement. This has been attributed to substrate effects that hindered the ability to accurately quantify the intensity values of the superlattice and fundamental reflections.

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