Characterization of AuPd Nanoparticles by Probe-Corrected Scanning Transmission Electron Microscopy and X-ray Absorption Spectroscopy

Frank Krumeich; Stefan Marx; Alfons Baiker; Reinhard Nesper

doi:10.1002/zaac.201100038

Characterization of AuPd Nanoparticles by Probe-Corrected Scanning Transmission Electron Microscopy and X-ray Absorption Spectroscopy

Zeitschrift für anorganische und allgemeine Chemie ◽

10.1002/zaac.201100038 ◽

2011 ◽

Vol 637 (7-8) ◽

pp. 875-881 ◽

Cited By ~ 6

Author(s):

Frank Krumeich ◽

Stefan Marx ◽

Alfons Baiker ◽

Reinhard Nesper

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Absorption Spectroscopy ◽

Scanning Transmission Electron Microscopy ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

X Ray Absorption

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Nearly Uniform Decaosmium Clusters Supported on MgO: Characterization by X-ray Absorption Spectroscopy and Scanning Transmission Electron Microscopy

The Journal of Physical Chemistry C ◽

10.1021/jp903309d ◽

2009 ◽

Vol 113 (30) ◽

pp. 13377-13385 ◽

Cited By ~ 7

Author(s):

Apoorva Kulkarni ◽

Shareghe Mehraeen ◽

Bryan W. Reed ◽

Norihiko L. Okamoto ◽

Nigel D. Browning ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Absorption Spectroscopy ◽

Scanning Transmission Electron Microscopy ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

X Ray Absorption

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Application of High-Angle Annular Dark Field Scanning Transmission Electron Microscopy, Scanning Transmission Electron Microscopy-Energy Dispersive X-ray Spectrometry, and Energy-Filtered Transmission Electron Microscopy to the Characterization of Nanoparticles in the Environment

Environmental Science & Technology ◽

10.1021/es026053t ◽

2003 ◽

Vol 37 (4) ◽

pp. 786-791 ◽

Cited By ~ 116

Author(s):

Satoshi Utsunomiya ◽

Rodney C. Ewing

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Dark Field ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Absolute-Scale Comparison with Simulation for Quantitative Energy-Dispersive X-Ray Spectroscopy in Atomic-Resolution Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927617002628 ◽

2017 ◽

Vol 23 (S1) ◽

pp. 388-389 ◽

Cited By ~ 1

Author(s):

S.D. Findlay ◽

Z. Chen ◽

M. Weyland ◽

X. Sang ◽

W. Xu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Energy Dispersive ◽

Atomic Resolution ◽

X Ray ◽

Scanning Transmission Electron ◽

Absolute Scale ◽

Transmission Electron ◽

Scanning Transmission

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Multivariate Statistics Applications in Scanning Transmission Electron Microscopy X-Ray Spectrum Imaging

Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-385983-9.00005-3 ◽

2011 ◽

pp. 249-295 ◽

Cited By ~ 8

Author(s):

Chad M. Parish

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Multivariate Statistics ◽

Scanning Transmission Electron Microscopy ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Spectrum Imaging

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Characterization of core/shell bi-metallic cube-shaped nanoparticles with scanning transmission electron microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927615006133 ◽

2015 ◽

Vol 21 (S3) ◽

pp. 1069-1070

Author(s):

Dalaver H. Anjum ◽

Akshaya Samal ◽

Manuel A. Roldan-Gutierrez

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Core Shell ◽

Scanning Transmission Electron ◽

Shaped Nanoparticles ◽

Transmission Electron ◽

Scanning Transmission

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Structure and Composition of Isolated Core-Shell(In,Ga)N/GaNRods Based on Nanofocus X-Ray Diffraction and Scanning Transmission Electron Microscopy

Physical Review Applied ◽

10.1103/physrevapplied.7.024033 ◽

2017 ◽

Vol 7 (2) ◽

Cited By ~ 9

Author(s):

Thilo Krause ◽

Michael Hanke ◽

Lars Nicolai ◽

Zongzhe Cheng ◽

Michael Niehle ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Core Shell ◽

X Ray Diffraction ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Atomic Characterization of Byproduct Nanoparticles on Cesium Lead Halide Nanocrystals Using High-Resolution Scanning Transmission Electron Microscopy

Crystals ◽

10.3390/cryst8010002 ◽

2017 ◽

Vol 8 (1) ◽

pp. 2 ◽

Cited By ~ 12

Author(s):

Mian Zhang ◽

Hongbo Li ◽

Qiang Jing ◽

Zhenda Lu ◽

Peng Wang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Lead Halide

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Structural Characterization of Fission Products in Irradiated TRISO Fuels using Transmission Kikuchi Diffraction, Transmission Electron Microscopy, and Synchrotron X-ray Absorption Spectroscopy

Microscopy and Microanalysis ◽

10.1017/s1431927617011801 ◽

2017 ◽

Vol 23 (S1) ◽

pp. 2228-2229

Author(s):

Rachel L. Seibert ◽

Jeff Terry ◽

Chad M. Parish ◽

John D. Hunn ◽

Charles A. Baldwin ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Absorption Spectroscopy ◽

Structural Characterization ◽

Fission Products ◽

X Ray ◽

Transmission Electron ◽

X Ray Absorption

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Characterization of a Layered Lithium Manganese-rich Oxide Cathode Material via Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927614004218 ◽

2014 ◽

Vol 20 (S3) ◽

pp. 498-499 ◽

Cited By ~ 2

Author(s):

Aaron C. Johnston-Peck ◽

Leonid A. Bendersky ◽

Andrew A. Herzing

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Cathode Material ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Oxide Cathode ◽

Lithium Manganese ◽

Transmission Electron ◽

Scanning Transmission

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Microstructural and compositional characterization of a new silicon carbide nanocables using scanning transmission electron microscopy

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/s1386-9477(02)00444-7 ◽

2002 ◽

Vol 15 (1) ◽

pp. 1-5 ◽

Cited By ~ 13

Author(s):

D.P Yu ◽

Y.J Xing ◽

M Tence ◽

H.Y Pan ◽

Y Leprince-Wang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Silicon Carbide ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Compositional Characterization

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