scholarly journals Determination of the efficiency of high purity germanium and silicon diode detectors for improved assessment of emission spectra delivered by medical X-ray tubes

2013 ◽  
Vol 42 (4) ◽  
pp. 201-206
Author(s):  
Sybelle Deloule ◽  
Johann Plagnard ◽  
Marc Denoziere ◽  
Isabelle Aubineau-Laniece
Keyword(s):  
High Purity ◽  
Emission Spectra ◽  
X Ray ◽  
Silicon Diode ◽  
High Purity Germanium

MEASUREMENT OF GERMANIUM ESCAPE PEAKS IN PIXE SPECTRA RECORDED USING HIGH PURITY Ge (HPGe) DETECTOR

2009 ◽  
Vol 19 (01n02) ◽  
pp. 67-76
Author(s):  
SANJIV KUMAR ◽  
G. L. N. REDDY ◽  
V. S. RAJU
Keyword(s):  
Quantitative Analysis ◽  
High Purity ◽  
Hpge Detector ◽  
X Rays ◽  
Pixe Analysis ◽  
Escape Peak ◽  
X Ray ◽  
High Purity Germanium ◽  
Experimental Values

This paper deals with studies on Ge K α and K β escape peaks in particle induced X-ray emission (PIXE) spectra recorded by a high purity germanium (HPGe) detector. A knowledge of the energies and intensities of these escape peaks is desirable for accurate qualitative as well as quantitative analysis of elements by PIXE. The spectral interferences caused by Ge K escape peaks in the determination of Fe in U by PIXE are highlighted for illustration. A simple theoretical approach based on the production of Ge K X-rays inside the Ge crystal of the detector during the process of detection of the incident characteristic X-rays and the subsequent escape of a fraction of the produced radiations from the crystal, is described to calculate the intensity ratio of the Ge escape peak to its parent characteristic X-rays. The calculated values are in agreement with the experimental values and those estimated using the formulation provided in GUPIX software for PIXE. The Ge K escape peaks are very prominent; the intensities of Ge K α escape peaks, from bromine to silver, range from 15% to 6% of those of their respective K α X-rays. These intensities are, in general, considerably higher compared to those of Si escape peaks in spectra recorded by Si ( Li ) detector. Ge K escape peaks therefore may give rise to severe interferences. The present approach provides a precise (~8%) determination of the intensity of an escape peak and thereby facilitates a reliable PIXE analysis.

scholarly journals Investigation of tube parameters on Xray spectra by MCNP5 code

2013 ◽  
Vol 16 (4) ◽  
pp. 20-25
Author(s):  
Khanh Ai Tran ◽  
Dung Thi Thuy Vo ◽  
Loan Thi Hong Mai ◽  
Nhon Van Mai ◽  
Phuong Nguyen Dang
Keyword(s):  
Quality Improvement ◽  
Absorbed Dose ◽  
Emission Spectra ◽  
Bremsstrahlung Spectrum ◽  
Dose Estimation ◽  
X Ray ◽  
Image Quality Improvement ◽  
Mcnp5 Code ◽  
Simulation Results

In diagnostic radiology, the determination of bremsstrahlung spectrum is essential for patient absorbed dose estimation and image quality improvement. In this paper, we surveyed the X-ray emission spectra of different peak voltages 50, 70, 85, 125 and 150 kV by using MCNP5 code. Besides, the effects of filter, collimator and anode material on X-ray spectra have also been investigated. The simulation results fairly agree with experimental spectra obtained by P.T. Talla et al. (2009)

scholarly journals Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals

2020 ◽  
Vol 53 (4) ◽  
pp. 880-884 ◽  
Author(s):  
Kevin-P. Gradwohl ◽  
Andreas N. Danilewsky ◽  
Melissa Roder ◽  
Martin Schmidbauer ◽  
József Janicskó-Csáthy ◽  
...  
Keyword(s):  
Single Crystals ◽  
High Purity ◽  
Direct Evidence ◽  
X Ray Diffraction ◽  
Structural Perfection ◽  
X Ray ◽  
High Purity Germanium ◽  
High Structural Perfection ◽  
Diffraction Imaging ◽  
General Method

White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation-free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection.

Direct determination of fluorine in high-purity water samples using vacuum sample chamber total reflection X-ray fluorescence spectrometry

2018 ◽  
Vol 33 (5) ◽  
pp. 876-882 ◽  
Author(s):  
Kaushik Sanyal ◽  
N. L. Misra
Keyword(s):  
High Purity ◽  
Water Samples ◽  
Vacuum Chamber ◽  
Direct Determination ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray ◽  
Sample Chamber

Trace levels of F in high-purity water samples were determined using vacuum chamber total reflection X-ray fluorescence spectrometry.

Magneto-optical determination of the ground state levels of some shallow impurities in high purity germanium

Physica B+C ◽  
1977 ◽  
Vol 89 ◽  
pp. 18-21 ◽  
Author(s):  
H.W.H.M. Jongbloets ◽  
J.H.M. Stoelinga ◽  
M.J.H. Van de Steeg ◽  
P. Wyder
Keyword(s):  
Ground State ◽  
High Purity ◽  
High Purity Germanium ◽  
Optical Determination ◽  
Shallow Impurities

scholarly journals Nano ZrO2 Synthesis by Extraction of Zr(IV) from ZrO(NO3)2 by PC88A, and Determination of Extraction Impurities by ICP-MS

Metals ◽  
2018 ◽  
Vol 8 (10) ◽  
pp. 851 ◽  
Author(s):  
Manh Chu ◽  
Lan Nguyen ◽  
Xuan Mai ◽  
Doan Thuan ◽  
Long Bach ◽  
...  
Keyword(s):  
Aqueous Phase ◽  
Organic Phase ◽  
High Purity ◽  
Internal Standard ◽  
Scale Production ◽  
Back Extraction ◽  
X Ray ◽  
Icp Ms ◽  
Determination Of Impurities

High purity Zirconium (Zr) materials are essential in many components of nuclear reactors, especially fuel cladding tubes. Due to the matrix influence, determination of impurities in the Zr materials requires separation from the Zr matrix. Among extraction methods, solvent extraction is common and suitable for large-scale production. In this study, extraction capability of Zr(IV) by 2-ethylhexyl phosphonic acid mono 2-ethylhexyl ester (PC88A) was examined by FT-IR and UV of ZrO(NO3)2 salt, PC88A-toluene solvent, and Zr-PC88A-toluene complex. ZrO2 (obtained from Institute for Technology of Radioactive and Rare Elements—ITRRE), after being separated from the Zr matrix, was determined for impurities using internal standard (indium, In) by 50% of PC88A dissolved in toluene. Separation of impurities from the Zr matrix underwent two stages. First, one cycle of extraction of the Zr matrix and impurities in 3 M HNO3 using 50% PC88A/toluene was conducted. Second, impurities were scrubbed by 4 M HNO3 in two cycles. Results revealed that approximately 74% of Zr(IV) was separated to the organic phase and 26% remained in the aqueous phase. Determination of impurities after separation from the Zr matrix by ICP-MS using internal standard in revealed that the recovery of impurities achieved 95–100%. With the mentioned amount of Zr, the effect of the Zr matrix on the determination of elements by ICP-MS is negligible. Levels of impurities have relative standard deviations (RSD) of less than 6.9% and recovery of 88.6–98.8%. Therefore, the determination of impurities has high reliability and accuracy. The back-extraction of Zr(IV) in organic phase by 1 M H2SO4 has stripped about 99.5% of the Zr matrix back to the aqueous phase. Following this, NH3 was added to the solution containing Zr after back-extraction to form Zr(OH)4 which was then desiccated to produce ZrO2. X-ray Diffraction (XRD), Scanning and Transmission Electron Microscopy (SEM and TEM) images showed that the new ZrO2 product has spherical nanostructure with diameters of less than 25 nm, which is suitable for applications for the treatment of colorants, metal ions in wastewater sources and manufacture of anti-corrosion steel. In addition, the energy dispersive X-ray (EDX) of the new ZrO2 product showed that it has high purity.

Determination of oxygen in acid-treated high-purity niobium by X-ray photoelectron spectroscopy

2015 ◽  
Vol 44 (2) ◽  
pp. 181-188 ◽  
Author(s):  
Kuan Wang ◽  
Bo Li ◽  
Baolian Sun ◽  
Pengwei Wang ◽  
Kai Zhou ◽  
...  
Keyword(s):  
High Purity ◽  
Photoelectron Spectroscopy ◽  
X Ray
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