X-ray fluorescence analysis of lead in tin coating using the theoretical intensity of scattered x-rays

2008 ◽  
Vol 37 (3) ◽  
pp. 245-248 ◽  
Author(s):  
H. Ochi ◽  
S. Watanabe ◽  
H. Nakamura
Keyword(s):  
Fluorescence Analysis ◽  
X Rays ◽  
Tin Coating ◽  
X Ray ◽  
Theoretical Intensity

An x-ray microprobe based upon a close-coupled focal-spot / glass capillary arrangement

1992 ◽  
Vol 50 (2) ◽  
pp. 1758-1759
Author(s):  
D. A. Carpenter ◽  
M. A. Taylor
Keyword(s):  
Imaging Techniques ◽  
Fluorescence Analysis ◽  
High Sensitivity ◽  
Specimen Preparation ◽  
X Rays ◽  
Glass Capillary ◽  
Close Coupling ◽  
X Ray ◽  
Point To Point ◽  
Beam Damage

The development of intense sources of x rays has led to renewed interest in the use of microbeams of x rays in x-ray fluorescence analysis. Sparks pointed out that the use of x rays as a probe offered the advantages of high sensitivity, low detection limits, low beam damage, and large penetration depths with minimal specimen preparation or perturbation. In addition, the option of air operation provided special advantages for examination of hydrated systems or for nondestructive microanalysis of large specimens.The disadvantages of synchrotron sources prompted the development of laboratory-based instrumentation with various schemes to maximize the beam flux while maintaining small point-to-point resolution. Nichols and Ryon developed a microprobe using a rotating anode source and a modified microdiffractometer. Cross and Wherry showed that by close-coupling the x-ray source, specimen, and detector, good intensities could be obtained for beam sizes between 30 and 100μm. More importantly, both groups combined specimen scanning with modern imaging techniques for rapid element mapping.

XRMF applications of a monolithic, polycapillary, focusing x-ray optic

1996 ◽  
Vol 54 ◽  
pp. 240-241
Author(s):  
D. A. Carpenter ◽  
Ning Gao ◽  
G. J. Havrilla
Keyword(s):  
Trace Elements ◽  
Point Source ◽  
Focal Spot ◽  
Fluorescence Analysis ◽  
X Rays ◽  
Focal Distance ◽  
Spot Diameter ◽  
X Ray ◽  
Focal Spot Diameter

A monolithic, polycapillary, x-ray optic was adapted to a laboratory-based x-ray microprobe to evaluate the potential of the optic for x-ray micro fluorescence analysis. The polycapillary was capable of collecting x-rays over a 6 degree angle from a point source and focusing them to a spot approximately 40 µm diameter. The high intensities expected from this capillary should be useful for determining and mapping minor to trace elements in materials. Fig. 1 shows a sketch of the capillary with important dimensions.The microprobe had previously been used with straight and with tapered monocapillaries. Alignment of the monocapillaries with the focal spot was accomplished by electromagnetically scanning the focal spot over the beveled anode. With the polycapillary it was also necessary to manually adjust the distance between the focal spot and the polycapillary.The focal distance and focal spot diameter of the polycapillary were determined from a series of edge scans.

How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod
Keyword(s):  
Thin Films ◽  
Penetration Depth ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Characteristic Features ◽  
Respective Characteristic ◽  
Nanometer Regime ◽  
Sensitive Method

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis

2005 ◽  
Vol 20 (2) ◽  
pp. 183-183
Author(s):  
Y. Kataoka ◽  
N. Kawahara ◽  
S. Hara ◽  
Y. Yamada ◽  
T. Matsuo ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Rays ◽  
X Ray ◽  
Fundamental Parameter Method

Rapid Quantitative Analysis by X-Ray Spectrometry

1971 ◽  
Vol 15 ◽  
pp. 164-175 ◽  
Author(s):  
Robert D. Giauque ◽  
Joseph M. Jaklevic
Keyword(s):  
Cross Sections ◽  
Fluorescence Analysis ◽  
Selective Excitation ◽  
Single Element ◽  
X Rays ◽  
Analysis Method ◽  
Yield Data ◽  
X Ray ◽  
Minimum Number ◽  
Sample Dilution

An x-ray fluorescence analysis method applicable to the case of fluorescent spectra excited with monoenergetic x-rays has been developed. The technique employs a minimum number of calibration steps using single element thin film standards and depends upon theoretical cross sections and fluorescent yield data to interpolate from element to element. The samples are treated as thin films and corrections for absorption effects are easily determined- Enhancement effects, if not negligible, are minimized by sample dilution techniques or by selective excitation.

Rapid Photon-Excited Energy-Dispersive X-Ray Fluorescence Analysis for Solid and Liquid Mineralogical Samples

1975 ◽  
Vol 19 ◽  
pp. 267-272 ◽  
Author(s):  
W. Ratyński ◽  
J. Parus ◽  
J. Tys ◽  
A. Ciszek
Keyword(s):  
Fluorescence Analysis ◽  
Semiconductor Detectors ◽  
X Rays ◽  
Copper Ore ◽  
X Ray ◽  
Large Numbers ◽  
Important Benefit ◽  
Versatile Tool ◽  
On Line ◽  
Set Up

X-ray fluorescence spectroscopy is new becoming a tool in research and. industry. Semiconductor detectors are proving valuable in measuring fluorescent X rays, and so are providing a versatile tool for rapid multielement analysis of many types of samples. This paper will mainly be concerned with, different types of copper ore. An experimental setup has been designed to determine Cu, Fe and Pb of concentration ranging from 0.1 to 20, to 5, and to 4 percent, respectively, with analytical precision of 20% relative at 0.1% Cu, and 3% relative at 20% Cu. For excitation a 100 mCi Pu-238 source and/or a low power air-cooled X-ray tube were used. Data acquisition and “on-line” evaluation for each sample takes about 100 seconds. Electronics blocks and sub-systems used In the set-up are available commercially. The most important benefit to be obtained from the setup is the ability to provide precise, reproducible determinations of large numbers of samples day after day.

The Gas Proportional Scintillation Counter as a Room-Temperature Detector For Energy-Dispersive X-Ray Fluorescence Analysis

1981 ◽  
Vol 25 ◽  
pp. 39-44 ◽  
Author(s):  
C. A. N. Conde ◽  
L. F. Requicha Ferreira ◽  
A. J. de Campos
Keyword(s):  
Room Temperature ◽  
Scintillation Counter ◽  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
X Rays ◽  
Mercuric Iodide ◽  
X Ray ◽  
Temperature Detector ◽  
Portable Instruments ◽  
Physical Principles

AbstractA review of the basic physical principles of the gas proportional scintillation counter is presented. Its performance is discussed and compared with that of other room-temperature detectors in regard to applications to portable instruments for energy-dispersive X-ray fluorescence analysis. It is concluded that the gas proportional scintillation counter is definitely superior to all other room-temperature detectors, except the mercuric iodide (HgI2) detector. For large areas or soft X-rays it is also superior to the HgI2 detector.

Micro-X-Ray Fluorescence Analysis on a Synchrotron Radiation Wiggler Beam Line

1991 ◽  
Vol 35 (B) ◽  
pp. 995-1000
Author(s):  
J.V. Gilfrich ◽  
E.F. Skelton ◽  
S.B. Qadri ◽  
N.E. Moulton ◽  
D.J. Nagel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
National Laboratory ◽  
Incident Beam ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Brookhaven National Laboratory ◽  
Beam Line ◽  
X Rays ◽  
X Ray ◽  
Electron Orbit

AbstractIt has been well established over recent years that synchrotron radiation possesses some unique features as a source of primary x-rays for x-ray fluorescence analysis. Advantage has been taken of the high intensity emanating from the bending magnets of storage rings to develop x-ray microprobes utilizing apertures or focussing optics, or both, to provide a beam spot at the specimen of the order of micrometers. The use of insertion devices wigglers and undulatora, can further increase the available intensity, especially for the high energy photons. Beam Line X-17C at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory, accepts the unmodified continuum radiation from a superconducting wiggler in the storage ring. Some initial XRF measurements have been made on this beam line using apertures in the 10 to 100 micrometer range. The fluorescent radiation was measured by an intrinsic Ge detector having an energy resolution of 300 eV at 15 kev, and located at 90° to the incident beam in the plane of the electron orbit. In samples containing many elements, detection limits of a few ppm were achieved with 100 μm beams.

Measurements of Soft and Ultrasoft X-Rays with Total Reflection Monochromator

1986 ◽  
Vol 30 ◽  
pp. 213-223
Author(s):  
Tomoya Arai
Keyword(s):  
Gas Flow ◽  
Bragg Reflection ◽  
Optical Resolution ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Rays ◽  
Light Elements ◽  
Lower Intensity ◽  
Measured Intensity ◽  
X Ray

The development of X-ray spectrographic analysis of light elements, which are O, C and B, has bee n performed for many applications using an end-window type X-ray tube with Rh-target and thin Be-window, wavelength dispersing devices, which are synthetic multilayers or total reflection mirror (with a specific filter) and a gas flow proportional counter with a thin film window. In Fig. 1 factors related to the intensity measurements in X-ray fluorescence analysis are shown. The excitation efficiency in the soft and ultrasoft X-ray region is very low because of the lower intensity of primary X-rays and low fluorescence yield of light elements. Instead of the wavelength dispersive method of Bragg reflection, having high resolution and low reflectivity, monochromatization combining total reflection by a selected mirror and an appropriate filter offered an alternate approach in order to increase measured intensity with reasonable optical resolution. Synthetic multilayers which have higher resolution and lower intensity compared with the performance of the mirror method have become popular for the detection of soft and ultrasoft X-ray region.

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