Model checking, testing and debugging

Abstract The problem of this research is : How is the language development of children age 12 to 24 months in Semarang ?. The purpose of this study is to describe widely and deeply about language development the children age 12 to 24 in Semarang. The method used in this research is qualitative method. Data collection is done by observation, interviews, and questionnaire. Data analysis techniques using Miles Hubermen’s model. Checking the validity of the data using triangulation data. The results showed that the development of language of children aged 12 to 24 months in Semarang in expressive is: can produce sound almost perfect in several words; Some of the letters of the words missing from the pronunciation; The missing letters are usually consonants; Haven't been able to pronounce the letter s and r; In General, most people are able to understand the speech of the children is an adult who is close to the child; There is a word that can be spelled perfectly by the child. The words are by and large is the words that are simple and close to the children's daily lives. As for the generally receptive: children can follow and obey what is spoken by adults; The children seem to understand when the adults were talking about them; and children can understand to the words that they heard more than that they can speak. Keywords: Language, children, expressive, receptive, word.

Download Full-text

Comparative Assessment of Optical Techniques for Semi-Invasive SRAM Data Read-out on an MSP430 Microcontroller

10.31399/asm.cp.istfa2018p0266 ◽

2018 ◽

Author(s):

Tuba Kiyan ◽

Heiko Lohrke ◽

Christian Boit

Keyword(s):

Supply Voltage ◽

Photon Emission ◽

Random Access ◽

Integration Time ◽

Security Evaluation ◽

Testing And Debugging ◽

Advantages And Disadvantages ◽

The Core ◽

Voltage Signal ◽

Chip Testing

Abstract This paper compares the three major semi-invasive optical approaches, Photon Emission (PE), Thermal Laser Stimulation (TLS) and Electro-Optical Frequency Mapping (EOFM) for contactless static random access memory (SRAM) content read-out on a commercial microcontroller. Advantages and disadvantages of these techniques are evaluated by applying those techniques on a 1 KB SRAM in an MSP430 microcontroller. It is demonstrated that successful read out depends strongly on the core voltage parameters for each technique. For PE, better SNR and shorter integration time are to be achieved by using the highest nominal core voltage. In TLS measurements, the core voltage needs to be externally applied via a current amplifier with a bias voltage slightly above nominal. EOFM can use nominal core voltages again; however, a modulation needs to be applied. The amplitude of the modulated supply voltage signal has a strong effect on the quality of the signal. Semi-invasive read out of the memory content is necessary in order to remotely understand the organization of memory, which finds applications in hardware and software security evaluation, reverse engineering, defect localization, failure analysis, chip testing and debugging.

Download Full-text