A General in situ Hydrothermal Rolling-Up Formation of One-Dimensional, Single-Crystalline Lead Telluride Nanostructures

Small ◽  
2005 ◽  
Vol 1 (3) ◽  
pp. 349-354 ◽  
Author(s):  
Lizhi Zhang ◽  
Jimmy C. Yu ◽  
Maosong Mo ◽  
Ling Wu ◽  
Kwan Wai Kwong ◽  
...  
2017 ◽  
Vol 43 (1) ◽  
pp. 610-616 ◽  
Author(s):  
Forat H. Alsultany ◽  
Z. Hassan ◽  
Naser M. Ahmed ◽  
Munirah Abdullah Almessiere

Author(s):  
D. Pulgarín ◽  
J. Plaza ◽  
J. Ruge ◽  
J. Rojas

This study proposes a methodology for the calibration of combined sewer overflow (CSO), incorporating the results of the three-dimensional ANSYS CFX model in the SWMM one-dimensional model. The procedure consists of constructing calibration curves in ANSYS CFX that relate the input flow to the CSO with the overflow, to then incorporate them into the SWMM model. The results obtained show that the behavior of the flow over the crest of the overflow weir varies in space and time. Therefore, the flow of entry to the CSO and the flow of excesses maintain a non-linear relationship, contrary to the results obtained in the one-dimensional model. However, the uncertainty associated with the idealization of flow methodologies in one dimension is reduced under the SWMM model with kinematic wave conditions and simulating CSO from curves obtained in ANSYS CFX. The result obtained facilitates the calibration of combined sewer networks for permanent or non-permanent flow conditions, by means of the construction of curves in a three-dimensional model, especially when the information collected in situ is limited.


2022 ◽  
Vol 71 (1) ◽  
pp. 016102-016102
Author(s):  
Li Ran-Ran ◽  
◽  
Zhang Yi-Fan ◽  
Yin Yu-Peng ◽  
Watanabe Hideo ◽  
...  

1996 ◽  
Vol 428 ◽  
Author(s):  
Marc J.C. Van Den Homberg ◽  
A. H. Verbruggen ◽  
P. F. A. Alkemade ◽  
S. Radelaar

AbstractThe continuing scaling-down of integrated circuits leads to increased metallization reliability problems, especially electromigration. We used 1/f noise measurements to study the relation between electromigration and microstructure. These measurements are very sensitive to the microstructural attributes, such as grain boundaries and dislocations. Al lines were grown by graphoepitaxy: First, a pure Al film was grown by dc magnetron sputtering on a groove pattern etched into a SiO2 substrate. The growth was then followed by an in situ rapid thermal anneal that resulted in a complete filling of the grooves with Al. These Al lines were carefully characterized with SEM and Backscatter Kikuchi Diffraction. Depending on the presence of a temperature gradient during the anneal, the lines were either nearly single-crystalline or bamboo with one grain per ∼ 3 μm. The resistivity was ∼ 2.8 μΩcm, only slightly higher than for bulk Al. We measured the 1/f noise with the two-channel ac technique at RT. We found in both bamboo as well as the single-crystalline lines a very low noise intensity; a factor two lower than in conventionally sputter deposited and annealed Al lines. No clear difference between the noise spectra of the bamboo and the single-crystalline lines was observed. We concluded that grain boundaries are not the only contributor to 1/f noise; other types of defects must play a role as well.


Author(s):  
Qiaoxin Zhang ◽  
Shaofeng Zhou ◽  
Jiaming Zhang ◽  
Liang Zhang ◽  
Lining Yang ◽  
...  

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