In situ measurements of the porosity on thin oxide films by IR emission spectrometry

1992 ◽  
Vol 18 (7) ◽  
pp. 571-575 ◽  
Author(s):  
P. Pigeat ◽  
N. Pacia ◽  
B. Weber
Keyword(s):  
Oxide Films ◽  
In Situ Measurements ◽  
Emission Spectrometry ◽  
Thin Oxide Films ◽  
Thin Oxide ◽  
Ir Emission

Characteristics of Ultra violet-Assisted Pulsed Laser Deposited Thin Oxide Films

2000 ◽  
Vol 623 ◽  
Author(s):  
V. Craciun ◽  
R.K. Singh
Keyword(s):  
Oxide Films ◽  
Pulsed Laser ◽  
Ultra Violet ◽  
Growth Conditions ◽  
Gaseous Species ◽  
Thin Oxide Films ◽  
Thin Oxide ◽  
Uv Photons ◽  
Substrate Temperatures

AbstractThe properties of thin oxide films such as Y2O3, ZnO and Ba0.5Sr0.5TiO3 grown using an in situ ultraviolet (UV)-assisted pulsed laser deposition (UVPLD) technique have been studied. With respect to films grown by conventional PLD under similar conditions but without UV illumination, the UVPLD grown films exhibited better structural and optical and electrical properties, especially for lower substrate temperatures. They also exhibited a better stoichiometry and contained less physisorbed oxygen than the conventional PLD grown layers. These improvements can be traced to several factors. Firstly, deep UV photons and ozone ensure a better in situ cleaning of the substrate prior to the deposition. Secondly, the presence of more reactive gaseous species like ozone and atomic oxygen formed by photodissociation of molecular O2 promotes the growth of more oxygenated films. Thirdly, absorption of UV photons by adatoms could result in an increased of their surface mobility. All these factors have a beneficial effect upon crystalline growth, especially for moderate substrate temperatures. For optimised growth conditions, the crystalline quality and properties of ultraviolet-assisted pulsed laser deposited films was similar to that of films grown using conventional PLD at substrate temperatures of at least 200°C higher.

Cover Picture: Photoinduced Formation of Wrinkled Microstructures with Long-Range Order in Thin Oxide Films (Adv. Mater. 24/2007)

2007 ◽  
Vol 19 (24) ◽  
pp. NA-NA
Author(s):  
M. Takahashi ◽  
T. Maeda ◽  
K. Uemura ◽  
J. Yao ◽  
Y. Tokuda ◽  
...  
Keyword(s):  
Long Range ◽  
Oxide Films ◽  
Range Order ◽  
Long Range Order ◽  
Thin Oxide Films ◽  
Thin Oxide
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