A Guide for the Meaningful Surface Analysis of Wood by XPS and ToF‐SIMS

2021 ◽  
Author(s):  
John F. Watts ◽  
Robyn E. Goacher
Keyword(s):  
Surface Analysis ◽  
Tof Sims

Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)

1999 ◽  
Vol 14 (3) ◽  
pp. 429-434 ◽  
Author(s):  
Geert Verlinden ◽  
Renaat Gijbels ◽  
Ingrid Geuens ◽  
Rene De Keyzer
Keyword(s):  
Surface Analysis ◽  
Time Of Flight ◽  
Tof Sims ◽  
Imaging Time

Applications in Catalysis of ToF-SIMS Surface Analysis by Mass Spectrometry

ChemInform ◽  
2003 ◽  
Vol 34 (7) ◽  
Author(s):  
Marco J. P. Hopstaken ◽  
Ralf Linke ◽  
Wouter J. H. van Gennip ◽  
J. W. Niemantsverdriet
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Tof Sims

Molecular surface analysis by TOF-SIMS

1992 ◽  
Vol 50 (2) ◽  
pp. 1556-1557
Author(s):  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Molecular Surface ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Static Conditions ◽  
Primary Ions ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) performs surface sensitive analysis of the elemental and molecular composition of solids. TOFSIMS is a relatively new embodiment of static secondary ion mass spectrometry (SSIMS) in which the dose of primary ions incident on the surface is typically less than 1012 ions/cm2. Since typical solid surfaces have an atomic density of 1015 atoms/cm2, this primary ion dose nominally removes less than 0.1% of a monolayer. Hence, SIMS analyses performed under these static conditions represent near surface analysis in which secondary ions are produced from the top few monolayers of the surface. The actual sampling depth is determined by the primary ion momentum, angle of incidence and chemistry of the surface. Since low dose primary ions cause minimal perturbation of the chemistry of the solid surface, SSIMS analyses often produce molecular or pseudo-molecular ions characteristic of the chemical composition of the surface. Thus, molecular ions or structurally significant fragment ions are often observed in SSIMS analyses of surfaces containing inorganic and organic residues, polymers surfaces, coatings, and biological materials such as tissues and membranes.

Copper Surface Analysis with ToF-SIMS: Spectra Interpretation and Stability Issues

2007 ◽  
pp. 371-374
Author(s):  
Chantal Trouiller ◽  
Sébastien Petitdidier ◽  
X. Ravanel ◽  
Lucile Broussous ◽  
M. Juhel ◽  
...  
Keyword(s):  
Surface Analysis ◽  
Copper Surface ◽  
Tof Sims ◽  
Stability Issues

Surface analysis of polyethyleneterephthalate by ESCA and TOF-SIMS

1997 ◽  
Vol 358 (1-2) ◽  
pp. 251-254 ◽  
Author(s):  
F.-R. Lang ◽  
Y. Pitton ◽  
H. J. Mathieu ◽  
D. Landolt ◽  
E. M. Moser
Keyword(s):  
Surface Analysis ◽  
Tof Sims

Static TOF-SIMS Surface Analysis of a CCl2F2Activated Chromia Catalyst Used for a Cl/F Exchange Reaction

2004 ◽  
Vol 108 (40) ◽  
pp. 15454-15456 ◽  
Author(s):  
Ercan Ünveren ◽  
Erhard Kemnitz ◽  
Umut Oran ◽  
Wolfgang E. S. Unger
Keyword(s):  
Exchange Reaction ◽  
Surface Analysis ◽  
Tof Sims
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