Part II: The influence of substrate type, film thickness, and primary ion type on molecular weight characterization of linear polydimethyl siloxane films by secondary ion mass spectrometry

Author(s):  
Paul R. Vlasak ◽  
Michaeleen L. Pacholski ◽  
Joo H. Kang ◽  
Kenneth L. Kearns ◽  
Carl W. Reinhardt
Nanoscale ◽  
2017 ◽  
Vol 9 (44) ◽  
pp. 17571-17575 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Piotr Gutowski ◽  
Dorota Pierścińska ◽  
Kamil Pierściński ◽  
Maciej Bugajski ◽  
...  

Non-uniform oxygen contamination in the superlattice region of a quantum cascade laser measured by secondary ion mass spectrometry.


2008 ◽  
Vol 80 (15) ◽  
pp. 5986-5992 ◽  
Author(s):  
Sutapa Ghosal ◽  
Stewart J. Fallon ◽  
Terrance J. Leighton ◽  
Katherine E. Wheeler ◽  
Michael J. Kristo ◽  
...  

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