X‐ray and UV photoelectron spectroscopy of Ag nanoclusters

2020 ◽  
Vol 52 (12) ◽  
pp. 1017-1022 ◽  
Author(s):  
Eleonora Bolli ◽  
Alessio Mezzi ◽  
Luca Burratti ◽  
Paolo Prosposito ◽  
Stefano Casciardi ◽  
...  
1977 ◽  
Vol 1 (1) ◽  
pp. 25-32 ◽  
Author(s):  
P.A. Zhdan ◽  
G.K. Boreskov ◽  
A.I. Boronin ◽  
A.P. Schepelin ◽  
W.F. Egelhoff ◽  
...  

2006 ◽  
Vol 18 (33) ◽  
pp. S2055-S2060 ◽  
Author(s):  
J H Seo ◽  
S J Kang ◽  
C Y Kim ◽  
K-H Yoo ◽  
C N Whang

2005 ◽  
Vol 480-481 ◽  
pp. 193-196 ◽  
Author(s):  
N. Guerfi ◽  
O. Bourbia ◽  
S. Achour

X-ray and UV photoelectron spectroscopy (XPS and UPS were used for studying the oxidation of Er films deposited on Ta substrate under ultra-high vacuum.Oxidation has been carried out at room temperatue with an oxygen pressure of 2x10-5 mbar.Erbium exposition to oxygen produces ; Er2O3 and a hydoxide.Subjecting the sample to a post annealing treatment at 750 °C dissociates the hydroxide and produces additional Er2O3.UPS and XPS valence band gives evidence that the formed oxide is Er2O3.


Materials ◽  
2021 ◽  
Vol 14 (15) ◽  
pp. 4189
Author(s):  
R. Lewandków ◽  
P. Mazur ◽  
A. Trembułowicz ◽  
A. Sabik ◽  
R. Wasielewski ◽  
...  

This paper concerns research on magnesium oxide layers in terms of their potential use as a gate material for SiC MOSFET structures. The two basic systems of MgO/SiC(0001) and MgO/graphite/SiC(0001) were deeply investigated in situ under ultrahigh vacuum (UHV). In both cases, the MgO layers were obtained by a reactive evaporation method. Graphite layers terminating the SiC(0001) surface were formed by thermal annealing in UHV. The physicochemical properties of the deposited MgO layers and the systems formed with their participation were determined using X-ray and UV photoelectron spectroscopy (XPS, UPS). The results confirmed the formation of MgO compounds. Energy level diagrams were constructed for both systems. The valence band maximum of MgO layers was embedded deeper on the graphitized surface than on the SiC(0001).


1986 ◽  
Vol 64 (3) ◽  
pp. 528-531 ◽  
Author(s):  
A. Katrib ◽  
B.D. El-Issa ◽  
A. W. Potts

The assignment of the four outermost ionization energies obtained by uv-photoelectron spectroscopy (UPS) of p-N,N-dimethylaminobenzalmalonitrile is given. The X-ray photoelectron spectroscopy of the N ls and C ls core levels are also discussed. Two "shake-up" lines were observed at the high binding energy side of the N ls spectral line. The energies of these spectral lines were found to correlate very well with the uv–visible spectrum. Also the energy difference of the two "shake-up" lines was found to be similar to the energy difference between the first and second ionization energies obtained by ups techniques. Only one "shake-up" line was observed in the case of C ls photoionization. Theoretical studies by semiempirical methods including HAM/3, MINDO/3, and extended Hückel are also discussed.


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