X-ray photoelectron spectroscopy study of neodymium niobate and tantalate precursors and thin films

2018 ◽  
Vol 51 (3) ◽  
pp. 326-335 ◽  
Author(s):  
Helena Brunckova ◽  
Hristo Kolev ◽  
Maria Kanuchova
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray

X-ray photoelectron spectroscopy study of Sn+ implanted a-Si1 − xCx:H thin films

1995 ◽  
Vol 29 (1-3) ◽  
pp. 165-169 ◽  
Author(s):  
N. Tzenov ◽  
D. Dimova-Malinovska ◽  
Ts. Marinova ◽  
V. Krastev ◽  
T. Tsvetkova
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray

scholarly journals Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study

2001 ◽  
Vol 89 (1) ◽  
pp. 212-216 ◽  
Author(s):  
A. Avila ◽  
I. Montero ◽  
L. Galán ◽  
J. M. Ripalda ◽  
R. Levy
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray

X-ray Photoelectron Spectroscopy Study of the Deposition of TiO2 Thin Films on Self-assembly Monolayer

1998 ◽  
Vol 14 (01) ◽  
pp. 57-62
Author(s):  
Xiao Zhong-Dang ◽  
◽  
Huang Dan ◽  
Gu Jian-Hua ◽  
Lu Zu-Hong
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Self Assembly ◽  
Spectroscopy Study ◽  
X Ray

An X-ray photoelectron spectroscopy study of BaAl2S4 thin films

2005 ◽  
Vol 148 (2) ◽  
pp. 91-95 ◽  
Author(s):  
Philippe F. Smet ◽  
Jo E. Van Haecke ◽  
Roland L. Van Meirhaeghe ◽  
Dirk Poelman
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray

X-Ray Photoelectron Spectroscopy Study of Pt-Oxide Thin Films Deposited by Reactive Sputtering Using O2/Ar Gas Mixtures

1999 ◽  
Vol 38 (Part 1, No. 8) ◽  
pp. 4872-4875 ◽  
Author(s):  
Min-Cherl Jung ◽  
Hyeong-Do Kim ◽  
Moonsup Han ◽  
William Jo ◽  
Dong Chun Kim
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Reactive Sputtering ◽  
Gas Mixtures ◽  
Spectroscopy Study ◽  
Oxide Thin Films ◽  
X Ray ◽  
Ar Gas

X-ray photoelectron spectroscopy study of polyimide thin films with Ar cluster ion depth profiling

2010 ◽  
Vol 28 (2) ◽  
pp. L1-L4 ◽  
Author(s):  
T. Miyayama ◽  
N. Sanada ◽  
M. Suzuki ◽  
J. S. Hammond ◽  
S.-Q. D. Si ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Depth Profiling ◽  
Spectroscopy Study ◽  
X Ray ◽  
Cluster Ion

X-ray Photoelectron Spectroscopy Study of Diamond-Like Carbon Thin Films Formed by Ar Gas Cluster Ion Beam-Assisted Fullerene Deposition

2008 ◽  
Vol 47 (5) ◽  
pp. 3380-3383 ◽  
Author(s):  
Yuichi Haruyama ◽  
Teruyuki Kitagawa ◽  
Kazuhiro Kanda ◽  
Shinji Matsui ◽  
Tatsuo Gejo ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Diamond Like Carbon ◽  
Spectroscopy Study ◽  
X Ray ◽  
Cluster Ion ◽  
Carbon Thin Films ◽  
Gas Cluster Ion Beam ◽  
Ar Gas
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