Hidden information in principal component analysis of ToF-SIMS data: On the use of correlation loadings for the identification of significant signals and structure elucidation

Danica Heller; Rik ter Veen; Birgit Hagenhoff; Carsten Engelhard

doi:10.1002/sia.6269

Hidden information in principal component analysis of ToF-SIMS data: On the use of correlation loadings for the identification of significant signals and structure elucidation

Surface and Interface Analysis ◽

10.1002/sia.6269 ◽

2017 ◽

Vol 49 (10) ◽

pp. 1028-1038 ◽

Cited By ~ 4

Author(s):

Danica Heller ◽

Rik ter Veen ◽

Birgit Hagenhoff ◽

Carsten Engelhard

Keyword(s):

Principal Component Analysis ◽

Structure Elucidation ◽

Principal Component ◽

Component Analysis ◽

Hidden Information ◽

Tof Sims

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Application of principal component analysis and tof-sims to mineral recognition, surface chemistry and separation by flotation

Geochimica et Cosmochimica Acta ◽

10.1016/j.gca.2006.06.1108 ◽

2006 ◽

Vol 70 (18) ◽

pp. A597 ◽

Cited By ~ 2

Author(s):

Roger St. C. Smart ◽

Brian Hart ◽

Mark Biesinger ◽

James Francis ◽

Tesfaye Negeri

Keyword(s):

Principal Component Analysis ◽

Surface Chemistry ◽

Principal Component ◽

Component Analysis ◽

Tof Sims

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Principal Component Analysis (PCA) of Surface Contamination by TOF-SIMS

10.1109/ipfa53173.2021.9617378 ◽

2021 ◽

Author(s):

Kei Lin Sek ◽

Pei Lin Lee ◽

Khin Yin Pang ◽

Younan Hua ◽

Lei Zhu ◽

...

Keyword(s):

Principal Component Analysis ◽

Principal Component ◽

Component Analysis ◽

Surface Contamination ◽

Tof Sims

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Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis

Surface and Interface Analysis ◽

10.1002/sia.6042 ◽

2016 ◽

Vol 48 (12) ◽

pp. 1328-1336 ◽

Cited By ~ 14

Author(s):

Peter J Cumpson ◽

Ian W Fletcher ◽

Naoko Sano ◽

Anders J Barlow

Keyword(s):

Principal Component Analysis ◽

Multivariate Analysis ◽

Large Scale ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Graphical Processor

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Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1446 ◽

2002 ◽

Vol 33 (12) ◽

pp. 924-931 ◽

Cited By ~ 13

Author(s):

Sally L. McArthur ◽

Matthew S. Wagner ◽

Patrick G. Hartley ◽

Keith M. McLean ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Depth Profiling of Organic Light-Emitting Diodes by ToF-SIMS Coupled with Wavelet–Principal Component Analysis

ACS Applied Polymer Materials ◽

10.1021/acsapm.9b00292 ◽

2019 ◽

Vol 1 (7) ◽

pp. 1821-1828 ◽

Cited By ~ 1

Author(s):

Céline Noël ◽

Nunzio Tuccitto ◽

Yan Busby ◽

Manuel Auer-Berger ◽

Antonino Licciardello ◽

...

Keyword(s):

Principal Component Analysis ◽

Light Emitting Diodes ◽

Depth Profiling ◽

Principal Component ◽

Component Analysis ◽

Organic Light Emitting Diodes ◽

Light Emitting ◽

Tof Sims ◽

Organic Light

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Enhancing and automating TOF-SIMS data interpretation using principal component analysis

Applied Surface Science ◽

10.1016/j.apsusc.2004.03.204 ◽

2004 ◽

Vol 231-232 ◽

pp. 217-223 ◽

Cited By ~ 32

Author(s):

Steven J. Pachuta

Keyword(s):

Principal Component Analysis ◽

Principal Component ◽

Data Interpretation ◽

Component Analysis ◽

Tof Sims

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Ambient-ageing processes in amine self-assembled monolayers on microarray slides as studied by ToF-SIMS with principal component analysis, XPS, and NEXAFS spectroscopy

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-012-5862-5 ◽

2012 ◽

Vol 403 (2) ◽

pp. 613-623 ◽

Cited By ~ 36

Author(s):

Hyegeun Min ◽

Pierre-Luc Girard-Lauriault ◽

Thomas Gross ◽

Andreas Lippitz ◽

Paul Dietrich ◽

...

Keyword(s):

Principal Component Analysis ◽

Principal Component ◽

Component Analysis ◽

Self Assembled Monolayers ◽

Nexafs Spectroscopy ◽

Tof Sims ◽

Ageing Processes ◽

Assembled Monolayers ◽

Self Assembled

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ToF-SIMS for the characterization of hyperbranched aliphatic polyesters: probing their molecular weight on surfaces based on principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1592 ◽

2003 ◽

Vol 35 (8) ◽

pp. 693-708 ◽

Cited By ~ 18

Author(s):

Géraldine Coullerez ◽

Stefan Lundmark ◽

Eva Malmström ◽

Anders Hult ◽

Hans Jörg Mathieu

Keyword(s):

Molecular Weight ◽

Principal Component Analysis ◽

Principal Component ◽

Component Analysis ◽

Aliphatic Polyesters ◽

Tof Sims

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ToF-SIMS Analysis of Adsorbed Proteins: Principal Component Analysis of the Primary Ion Species Effect on the Protein Fragmentation Patterns

The Journal of Physical Chemistry C ◽

10.1021/jp208035x ◽

2011 ◽

Vol 115 (49) ◽

pp. 24247-24255 ◽

Cited By ~ 52

Author(s):

Shin Muramoto ◽

Daniel J. Graham ◽

Matthew S. Wagner ◽

Tae Geol Lee ◽

Dae Won Moon ◽

...

Keyword(s):

Principal Component Analysis ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Species Effect ◽

Adsorbed Proteins ◽

Sims Analysis ◽

Fragmentation Patterns ◽

Ion Species ◽

Protein Fragmentation

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Principal Component Analysis of TOF-SIMS Images of Organic Monolayers

Analytical Chemistry ◽

10.1021/ac020311n ◽

2002 ◽

Vol 74 (22) ◽

pp. 5711-5716 ◽

Cited By ~ 66

Author(s):

Mark C. Biesinger ◽

Pierre-Yves Paepegaey ◽

N. Stewart McIntyre ◽

Robert R. Harbottle ◽

Nils O. Petersen

Keyword(s):

Principal Component Analysis ◽

Principal Component ◽

Component Analysis ◽

Organic Monolayers ◽

Tof Sims

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