Surface analysis of ripple pattern on PS and PEN induced with ring-shaped mask due to KrF laser treatment

2016 ◽  
Vol 49 (1) ◽  
pp. 25-33 ◽  
Author(s):  
O. Neděla ◽  
P. Slepička ◽  
P. Sajdl ◽  
M. Veselý ◽  
V. Švorčík
2008 ◽  
Author(s):  
Sónia Eugénio ◽  
Rui Vilar ◽  
Vitor Oliveira ◽  
Manickam Sivakumar

1986 ◽  
Vol 74 ◽  
Author(s):  
Q. Y. Ying ◽  
H. S. Kwok

AbstractA KrF laser was used to produce ions from an aluminum surface. The threshold energy fluence was found to be ∼30 mJ/cm2 which was lower than similar studies on the ablation of metals. The measured threshold however, was of the same order of magnitude for atomic desorption from semiconductor surfaces. This process can be used to perform surface analysis without ablation damage.


2012 ◽  
Vol 110 (3) ◽  
pp. 633-637 ◽  
Author(s):  
Hedieh Pazokian ◽  
Mahmoud Mollabashi ◽  
Alexandros Selimis ◽  
Emmanuel Stratakis ◽  
Jalal Barzin ◽  
...  

1983 ◽  
Vol 44 (C2) ◽  
pp. C2-19-C2-25
Author(s):  
M. C. Gower ◽  
R. G. Caro

1995 ◽  
Vol 131 (5) ◽  
pp. 621-623 ◽  
Author(s):  
D. J. Goldberg
Keyword(s):  

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