Core-shell structure of fly ash particles - SIMS depth profile analysis

P. Konarski; A. Zawada; D. Kowalczyk; K. Juda-Rezler

doi:10.1002/sia.5143

Core-shell structure of fly ash particles - SIMS depth profile analysis

Surface and Interface Analysis ◽

10.1002/sia.5143 ◽

2012 ◽

Vol 45 (1) ◽

pp. 592-595 ◽

Cited By ~ 4

Author(s):

P. Konarski ◽

A. Zawada ◽

D. Kowalczyk ◽

K. Juda-Rezler

Keyword(s):

Fly Ash ◽

Depth Profile ◽

Shell Structure ◽

Profile Analysis ◽

Core Shell ◽

Depth Profile Analysis ◽

Core Shell Structure ◽

Sims Depth Profile

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Highly effective chromium immobilization by an ultrafine fly ash-based core-shell structure

Journal of the Taiwan Institute of Chemical Engineers ◽

10.1016/j.jtice.2021.07.020 ◽

2021 ◽

Author(s):

Yuxuan Yang ◽

Hui Li ◽

Wukui Zheng

Keyword(s):

Fly Ash ◽

Shell Structure ◽

Core Shell ◽

Highly Effective ◽

Core Shell Structure

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Comparative XPS and SIMS depth profile analysis of Cu-implanted silicon: evidence of segregation effects

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(90)90605-t ◽

1990 ◽

Vol 52 (1) ◽

pp. 79-82 ◽

Cited By ~ 4

Author(s):

E. Darque-Ceretti ◽

M. Aucouturier

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Sims Depth Profile

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SIMS depth profile analysis for investigations of the lithium-diffusion in hydrogenated amorphous silicon

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00321389 ◽

1993 ◽

Vol 346 (1-3) ◽

pp. 92-95 ◽

Cited By ~ 8

Author(s):

U. Zastrow ◽

W. Beyer ◽

J. Herion

Keyword(s):

Amorphous Silicon ◽

Depth Profile ◽

Profile Analysis ◽

Hydrogenated Amorphous Silicon ◽

Depth Profile Analysis ◽

Lithium Diffusion ◽

Hydrogenated Amorphous ◽

Sims Depth Profile

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Synthesis and properties of organo-fly ash/polyaniline with core/shell structure based on emulsion polymerization

Chinese Journal of Polymer Science ◽

10.1007/s10118-012-1173-8 ◽

2012 ◽

Vol 30 (6) ◽

pp. 808-814 ◽

Cited By ~ 1

Author(s):

Xi-ping Lei ◽

Qi Su ◽

Juan Fan

Keyword(s):

Fly Ash ◽

Emulsion Polymerization ◽

Shell Structure ◽

Core Shell ◽

Core Shell Structure

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Cold plasma cleaning of copper and aluminum tested by SIMS depth profile analysis

Surface and Interface Analysis ◽

10.1002/sia.3655 ◽

2010 ◽

Vol 43 (1-2) ◽

pp. 612-617 ◽

Cited By ~ 2

Author(s):

P. Konarski ◽

T. Opalińska

Keyword(s):

Depth Profile ◽

Cold Plasma ◽

Profile Analysis ◽

Plasma Cleaning ◽

Depth Profile Analysis ◽

Sims Depth Profile

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Ion beam shadowing effects in SIMS depth profile analysis of MBE-grown nanostructures

Vacuum ◽

10.1016/j.vacuum.2005.01.041 ◽

2005 ◽

Vol 78 (2-4) ◽

pp. 291-295 ◽

Cited By ~ 2

Author(s):

M. Ćwil ◽

P. Konarski

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Ion Beam ◽

Depth Profile Analysis ◽

Shadowing Effects ◽

Sims Depth Profile

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Application of ‘Storing Matter’ technique in SIMS depth profile analysis

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2018.05.017 ◽

2019 ◽

Vol 450 ◽

pp. 153-156 ◽

Cited By ~ 1

Author(s):

M. Miśnik ◽

P. Konarski ◽

A. Zawada ◽

J. Ażgin

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Sims Depth Profile

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SIMS depth profile analysis of particles collected in an urban environment

Surface and Interface Analysis ◽

10.1002/sia.3666 ◽

2010 ◽

Vol 43 (1-2) ◽

pp. 470-474 ◽

Cited By ~ 2

Author(s):

P. Konarski ◽

K. Kaczorek ◽

B. Balcerzak ◽

J. Haluszka ◽

M. Scibor ◽

...

Keyword(s):

Urban Environment ◽

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Sims Depth Profile

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SIMS depth profile analysis of sodium in silicon dioxide

Applied Surface Science ◽

10.1016/j.apsusc.2008.05.069 ◽

2008 ◽

Vol 255 (4) ◽

pp. 860-862 ◽

Cited By ~ 10

Author(s):

Y. Yamamoto ◽

N. Shimodaira

Keyword(s):

Silicon Dioxide ◽

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Sims Depth Profile

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SIMS depth profile analysis of tribological coatings on curved surfaces: Influence of ion impact angle and take‐off angle on ion yield and on the quantitative analysis of chemical composition

Surface and Interface Analysis ◽

10.1002/sia.6641 ◽

2019 ◽

Vol 51 (7) ◽

pp. 703-711

Author(s):

Kirsten Ingolf Schiffmann

Keyword(s):

Quantitative Analysis ◽

Chemical Composition ◽

Depth Profile ◽

Profile Analysis ◽

Impact Angle ◽

Curved Surfaces ◽

Depth Profile Analysis ◽

Tribological Coatings ◽

Ion Impact ◽

Sims Depth Profile

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