Growth of thin epitaxial alumina films onto Ni(111): an electron spectroscopy and diffraction study

2010 ◽  
Vol 42 (10-11) ◽  
pp. 1581-1584 ◽  
Author(s):  
Slavomir Nemsak ◽  
Tomas Skala ◽  
Michiko Yoshitake ◽  
Nataliya Tsud ◽  
Taeyoung Kim ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Electron Spectroscopy ◽  
Alumina Films

Electron-spectroscopy and -diffraction study of the conductivity of CVD diamond ()2×1 surface

2003 ◽  
Vol 529 (1-2) ◽  
pp. 180-188 ◽  
Author(s):  
S. Kono ◽  
T. Takano ◽  
M. Shimomura ◽  
T. Goto ◽  
K. Sato ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Electron Spectroscopy ◽  
Cvd Diamond

scholarly journals Long-range ordering in anodic alumina films: a microradian X-ray diffraction study

2010 ◽  
Vol 43 (3) ◽  
pp. 531-538 ◽  
Author(s):  
Kirill S. Napolskii ◽  
Ilya V. Roslyakov ◽  
Andrey A. Eliseev ◽  
Andrei V. Petukhov ◽  
Dmytro V. Byelov ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Long Range ◽  
Film Growth ◽  
Orientational Order ◽  
Anodic Alumina ◽  
X Ray Diffraction ◽  
X Ray ◽  
Alumina Films ◽  
Self Organized ◽  
Long Range Ordering

A quantitative analysis of long-range order in the self-organized porous structure of anodic alumina films has been performed on the basis of a microradian X-ray diffraction study. The structure is shown to possess orientational order over macroscopic distances larger than 1 mm. At the same time, the interpore positional order is only short-range and does not extend over more than ∼10 interpore distances. These positional correlations are mostly lost gradually rather than at the domain boundaries, as suggested by the divergence of the peak width for the higher-order reflections. In the direction of the film growth the pores have a very long longitudinal self-correlation length of the order of tens of micrometres.

Subnanometer Aluminium Oxide Film as a Model Photochemical Sensor

2015 ◽  
Vol 644 ◽  
pp. 153-156 ◽  
Author(s):  
Inga Tvauri ◽  
Soslan Khubezhov ◽  
Bela Gergieva ◽  
Viktoria Magkoeva ◽  
Galina Grigorkina ◽  
...  
Keyword(s):  
Oxide Film ◽  
Electron Spectroscopy ◽  
Film Structure ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Alumina Films ◽  
Resolution Electron ◽  
Ultrathin Oxide ◽  
Electron Energy Loss ◽  
Aluminium Oxide Film

The growth and the atomic structure of alumina films of submonolayer to multilayer thickness evaporated onto the surface of Mo (110) crystal have been studied by Auger electron spectroscopy, high resolution electron energy loss spectroscopy and scanning tunneling microscopy. It is shown that the stoichiometry of the submonolayer film corresponds to that of the bulk oxide, and after achieving two monolayers the properties of the film largely resemble the properties of massive alumina. Deposition of the oxide at a substrate temperature of 1100 K results in the film structure corresponding to α-Al2O3. Such ultrathin oxide film is of considerable potential application in sensor physics and technology.

A standard for transmission electron spectroscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 530-531 ◽  
Author(s):  
Dennis Maher ◽  
David Joy ◽  
Peggy Mochel
Keyword(s):  
Thin Films ◽  
Electron Spectroscopy ◽  
Host Lattice ◽  
Single Element ◽  
Multicomponent Systems ◽  
Transmission Electron ◽  
Major Interest ◽  
Standard Specimens ◽  
Forms Of Carbon ◽  
Electron Energy Loss

A variety of standard specimens is needed in order to systematically investigate the instrumentation, specimen, data reduction and quantitation variables in electron energy-loss spectroscopy (EELS). Pure single element specimens (e.g. various forms of carbon) have received considerable attention to date but certain elements of interest cannot be prepared directly as thin films. Since studies of the first and second row elements in two- or multicomponent systems will be of considerable importance in microanalysis using EELS, there is a need for convenient standards containing these species. For many investigations a standard should contain the desired element, or elements, homogeneously dispersed through a suitable matrix and at an accurately known concentration. These conditions may be met by the technique of implantation.Silicon was chosen as the host lattice since its principal ionization energies, EL23 = 98 eV and Ek = 1843 eV, are well removed from the K-edges of most elements of major interest such as boron (Ek = 188 eV), carbon (Ek = 283 eV), nitrogen (Ek = 400 eV) and oxygen (Ek = 532 eV).

Valence electron spectroscopy of inhomogeneous media

1992 ◽  
Vol 50 (2) ◽  
pp. 1150-1151
Author(s):  
A. Howie ◽  
D.W. McComb
Keyword(s):  
Specific Gravity ◽  
Loss Function ◽  
Electron Spectroscopy ◽  
Valence Electron ◽  
Peak Height ◽  
Loss Functions ◽  
Loss Peak ◽  
High Energies ◽  
Valence Electron Density ◽  
Electron Microscopist

The bulk loss function Im(-l/ε (ω)), a well established tool for the interpretation of valence loss spectra, is being progressively adapted to the wide variety of inhomogeneous samples of interest to the electron microscopist. Proportionality between n, the local valence electron density, and ε-1 (Sellmeyer's equation) has sometimes been assumed but may not be valid even in homogeneous samples. Figs. 1 and 2 show the experimentally measured bulk loss functions for three pure silicates of different specific gravity ρ - quartz (ρ = 2.66), coesite (ρ = 2.93) and a zeolite (ρ = 1.79). Clearly, despite the substantial differences in density, the shift of the prominent loss peak is very small and far less than that predicted by scaling e for quartz with Sellmeyer's equation or even the somewhat smaller shift given by the Clausius-Mossotti (CM) relation which assumes proportionality between n (or ρ in this case) and (ε - 1)/(ε + 2). Both theories overestimate the rise in the peak height for coesite and underestimate the increase at high energies.

Grain boundary segregation in metals

1992 ◽  
Vol 50 (2) ◽  
pp. 1204-1205
Author(s):  
C.L. Briant
Keyword(s):  
Fracture Surface ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Material Properties ◽  
Electron Spectroscopy ◽  
High Vacuum ◽  
Boundary Segregation ◽  
Grain Boundary Segregation ◽  
Local Concentration ◽  
The One

Grain boundary segregation is the process by which solute elements in a material diffuse to the grain boundaries, become trapped there, and increase their local concentration at the boundary over that in the bulk. As a result of this process this local concentration of the segregant at the grain boundary can be many orders of magnitude greater than the bulk concentration of the segregant. The importance of this problem lies in the fact that grain boundary segregation can affect many material properties such as fracture, corrosion, and grain growth.One of the best ways to study grain boundary segregation is with Auger electron spectroscopy. This spectroscopy is an extremely surface sensitive technique. When it is used to study grain boundary segregation the sample must first be fractured intergranularly in the high vacuum spectrometer. This fracture surface is then the one that is analyzed. The development of scanning Auger spectrometers have allowed researchers to first image the fracture surface that is created and then to perform analyses on individual grain boundaries.

Angular Resolved Electron Spectroscopy with Parallel Recording

1990 ◽  
Vol 48 (2) ◽  
pp. 370-371
Author(s):  
Huang Min ◽  
P.S. Flora ◽  
C.J. Harland ◽  
J.A. Venables
Keyword(s):  
Electron Spectroscopy ◽  
Low Voltage ◽  
Solid Angle ◽  
Detection System ◽  
Voltage Electron ◽  
Cylindrical Mirror ◽  
Inner Radius ◽  
Channel Plate ◽  
And Performance ◽  
Type Detector

A cylindrical mirror analyser (CMA) has been built with a parallel recording detection system. It is being used for angular resolved electron spectroscopy (ARES) within a SEM. The CMA has been optimised for imaging applications; the inner cylinder contains a magnetically focused and scanned, 30kV, SEM electron-optical column. The CMA has a large inner radius (50.8mm) and a large collection solid angle (Ω > 1sterad). An energy resolution (ΔE/E) of 1-2% has been achieved. The design and performance of the combination SEM/CMA instrument has been described previously and the CMA and detector system has been used for low voltage electron spectroscopy. Here we discuss the use of the CMA for ARES and present some preliminary results.The CMA has been designed for an axis-to-ring focus and uses an annular type detector. This detector consists of a channel-plate/YAG/mirror assembly which is optically coupled to either a photomultiplier for spectroscopy or a TV camera for parallel detection.

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