XPS-depth analysis using C60ion sputtering of buried interface in plasma-treated ethylene-tetrafluoroethylene-copolymer (ETFE) film
2008 ◽
Vol 40
(13)
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pp. 1631-1634
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1996 ◽
Vol 54
◽
pp. 694-695
2019 ◽
Vol 21
(44)
◽
pp. 24478-24488
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Keyword(s):
Keyword(s):
2016 ◽
Vol 10
(1)
◽
pp. 54-60
Keyword(s):
Keyword(s):