Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter

2002 ◽  
Vol 34 (1) ◽  
pp. 206-210 ◽  
Author(s):  
S. Gurban ◽  
G. Gergely ◽  
M. Menyhard ◽  
J. Adam ◽  
M. Adamik ◽  
...  
Keyword(s):  
Experimental Determination ◽  
Free Path ◽  
Electron Spectroscopy ◽  
Mean Free Path ◽  
Excitation Parameter ◽  
Elastic Peak ◽  
Surface Excitation ◽  
Inelastic Mean Free Path ◽  
Reference Samples

Inelastic Mean Free Path Data for Si Corrected for Surface Excitation

2005 ◽  
Vol 11 (6) ◽  
pp. 581-585
Author(s):  
Gábor Tamás Orosz ◽  
György Gergely ◽  
Sándor Gurbán ◽  
Miklós Menyhard ◽  
Aleksander Jablonski
Keyword(s):  
Monte Carlo ◽  
Electron Transport ◽  
Free Path ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Mean Free Path ◽  
Thin Layers ◽  
Elastic Peak ◽  
Surface Excitation ◽  
Inelastic Mean Free Path

Surface-sensitive electron spectroscopies, like Auger electron spectroscopy, X-ray photoelectron spectroscopy and elastic peak electron spectroscopy (EPES) are suitable techniques to investigate surfaces and thin layers. A theoretical model for electron transport is needed to process the observed electron spectra. Electron transport descriptions are based on the differential elastic cross sections for the sample atoms and the inelastic mean free path (IMFP) of backscattered electrons. An electron impinging on the sample can lose energy either due to surface or volume excitations. In the present work a Monte Carlo (MC) simulation of the elastic peak of Si, Ag, Ni, Cu, and Au for surface analysis is presented. The IMFP of Si was determined applying the EPES method. The integrated elastic peak ratio of Si with the standard metal reference samples corrected for surface excitation provided IMFP values of Si in the energy range E = 0.2–2.0 keV. Experiments were made with the ESA 31 HSA (ATOMKI) and with the DESA-100 (Staib) spectrometers. Surface correction was based on the application of Chen's model and material parameters. The Monte Carlo simulations of elastically backscattered electron trajectories were made using new EPESWIN software of Jablonski. An improvement of IMFP experimental results was achieved applying the presented procedure.

Determination of the inelastic mean free path of electrons in polythiophenes using elastic peak electron spectroscopy method

2001 ◽  
Vol 174 (1) ◽  
pp. 70-85 ◽  
Author(s):  
B. Lesiak ◽  
A. Kosinski ◽  
A. Jablonski ◽  
L. Kövér ◽  
J. Tóth ◽  
...  
Keyword(s):  
Free Path ◽  
Electron Spectroscopy ◽  
Mean Free Path ◽  
Spectroscopy Method ◽  
Elastic Peak ◽  
Inelastic Mean Free Path
Sign in / Sign up

Export Citation Format

Share Document