68‐2: Data‐driven Image Enhancement Using Deep Neural Networks for a Display Image Pipeline

2019 ◽  
Vol 50 (1) ◽  
pp. 961-964
Author(s):  
Sewhan Na ◽  
Woohyuk Jang ◽  
Hyunwook Lim ◽  
Jaeyoul Lee ◽  
Imsoo Kang
Keyword(s):  
Neural Networks ◽  
Image Enhancement ◽  
Deep Neural Networks ◽  
Data Driven

scholarly journals High accuracy data-driven heliostat calibration and state prediction with pretrained deep neural networks

Solar Energy ◽  
2021 ◽  
Vol 218 ◽  
pp. 48-56
Author(s):  
Max Pargmann ◽  
Daniel Maldonado Quinto ◽  
Peter Schwarzbözl ◽  
Robert Pitz-Paal
Keyword(s):  
Neural Networks ◽  
Deep Neural Networks ◽  
High Accuracy ◽  
Data Driven ◽  
State Prediction ◽  
Accuracy Data

Framework for TCAD augmented machine learning on multi- I–V characteristics using convolutional neural network and multiprocessing

2021 ◽  
Vol 42 (12) ◽  
pp. 124101
Author(s):  
Thomas Hirtz ◽  
Steyn Huurman ◽  
He Tian ◽  
Yi Yang ◽  
Tian-Ling Ren
Keyword(s):  
Machine Learning ◽  
Neural Networks ◽  
Information Technologies ◽  
Deep Neural Networks ◽  
State Of The Art ◽  
Data Driven ◽  
Sufficient Data ◽  
Learning Models ◽  
Simulation Tools ◽  
New Information

Abstract In a world where data is increasingly important for making breakthroughs, microelectronics is a field where data is sparse and hard to acquire. Only a few entities have the infrastructure that is required to automate the fabrication and testing of semiconductor devices. This infrastructure is crucial for generating sufficient data for the use of new information technologies. This situation generates a cleavage between most of the researchers and the industry. To address this issue, this paper will introduce a widely applicable approach for creating custom datasets using simulation tools and parallel computing. The multi-I–V curves that we obtained were processed simultaneously using convolutional neural networks, which gave us the ability to predict a full set of device characteristics with a single inference. We prove the potential of this approach through two concrete examples of useful deep learning models that were trained using the generated data. We believe that this work can act as a bridge between the state-of-the-art of data-driven methods and more classical semiconductor research, such as device engineering, yield engineering or process monitoring. Moreover, this research gives the opportunity to anybody to start experimenting with deep neural networks and machine learning in the field of microelectronics, without the need for expensive experimentation infrastructure.

A joint deep neural networks-based method for single nighttime rainy image enhancement

2019 ◽  
Vol 32 (7) ◽  
pp. 1913-1926 ◽  
Author(s):  
Zhenghao Shi ◽  
Yaning Feng ◽  
Minghua Zhao ◽  
Lifeng He
Keyword(s):  
Neural Networks ◽  
Image Enhancement ◽  
Deep Neural Networks

scholarly journals Physics-Driven Regularization of Deep Neural Networks for Enhanced Engineering Design and Analysis

2019 ◽  
Vol 20 (1) ◽  
Author(s):  
Mohammad Amin Nabian ◽  
Hadi Meidani
Keyword(s):  
Neural Networks ◽  
Engineering Design ◽  
Physical System ◽  
Deep Neural Networks ◽  
Complete Information ◽  
Training Data ◽  
Data Driven ◽  
Training Approach ◽  
Domain Expertise ◽  
Generalization Errors

Abstract In this paper, we introduce a physics-driven regularization method for training of deep neural networks (DNNs) for use in engineering design and analysis problems. In particular, we focus on the prediction of a physical system, for which in addition to training data, partial or complete information on a set of governing laws is also available. These laws often appear in the form of differential equations, derived from first principles, empirically validated laws, or domain expertise, and are usually neglected in a data-driven prediction of engineering systems. We propose a training approach that utilizes the known governing laws and regularizes data-driven DNN models by penalizing divergence from those laws. The first two numerical examples are synthetic examples, where we show that in constructing a DNN model that best fits the measurements from a physical system, the use of our proposed regularization results in DNNs that are more interpretable with smaller generalization errors, compared with other common regularization methods. The last two examples concern metamodeling for a random Burgers’ system and for aerodynamic analysis of passenger vehicles, where we demonstrate that the proposed regularization provides superior generalization accuracy compared with other common alternatives.

scholarly journals Interpretable, Data-Efficient and Verifiable Autonomy with High-Level Knowledge

2020 ◽  
Author(s):  
Zhe Xu
Keyword(s):  
Artificial Intelligence ◽  
Neural Networks ◽  
Deep Neural Networks ◽  
Autonomous Systems ◽  
Real Data ◽  
Data Driven ◽  
Knowledge Representations ◽  
Limited Availability ◽  
High Level ◽  
Level Performance

<p>Despite the fact that artificial intelligence boosted with data-driven methods (e.g., deep neural networks) has surpassed human-level performance in various tasks, its application to autonomous</p> <p>systems still faces fundamental challenges such as lack of interpretability, intensive need for data and lack of verifiability. In this overview paper, I overview some attempts to address these fundamental challenges by explaining, guiding and verifying autonomous systems, taking into account limited availability of simulated and real data, the expressivity of high-level</p> <p>knowledge representations and the uncertainties of the underlying model. Specifically, this paper covers learning high-level knowledge from data for interpretable autonomous systems,</p><p>guiding autonomous systems with high-level knowledge, and</p><p>verifying and controlling autonomous systems against high-level specifications.</p>

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