An experimental model of beam broadening in the variable pressure scanning electron microscope

Xiaohu Tang; David C. Joy

doi:10.1002/sca.4950270604

An experimental model of beam broadening in the variable pressure scanning electron microscope

Scanning ◽

10.1002/sca.4950270604 ◽

2005 ◽

Vol 27 (6) ◽

pp. 293-297 ◽

Cited By ~ 7

Author(s):

Xiaohu Tang ◽

David C. Joy

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Experimental Model ◽

Variable Pressure ◽

Scanning Electron ◽

Beam Broadening

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Micromodification of silicon dioxide in a variable pressure/environmental scanning electron microscope

Applied Physics Letters ◽

10.1063/1.1415773 ◽

2001 ◽

Vol 79 (19) ◽

pp. 3050-3052 ◽

Cited By ~ 11

Author(s):

Marion A. Stevens-Kalceff

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Silicon Dioxide ◽

Environmental Scanning Electron Microscope ◽

Variable Pressure ◽

Environmental Scanning ◽

Scanning Electron

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SI-27, A Novel Inhibitor of Matrix Metalloproteinases with Antiangiogenic Activity: Detection with a Variable-pressure Scanning Electron Microscope

Neurosurgery ◽

10.1097/00006123-200203000-00028 ◽

2002 ◽

Vol 50 (3) ◽

pp. 578-587 ◽

Cited By ~ 1

Author(s):

Daizo Yoshida ◽

Masahiro Noha ◽

Kunihiro Watanabe ◽

Yuichi Sugisaki ◽

Akira Teramoto

Keyword(s):

Electron Microscope ◽

Matrix Metalloproteinases ◽

Scanning Electron Microscope ◽

Variable Pressure ◽

Activity Detection ◽

Antiangiogenic Activity ◽

Scanning Electron

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Scintillation SE Detector for Variable Pressure Scanning Electron Microscope

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_280 ◽

2009 ◽

pp. 559-560 ◽

Cited By ~ 1

Author(s):

J. Jirak ◽

P. Cernoch ◽

V. Nedela ◽

J. Spinka

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Variable Pressure ◽

Scanning Electron

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Time Resolved Analysis of the Positive Ion Dynamics in the Variable Pressure Scanning Electron Microscope

Microscopy and Microanalysis ◽

10.1017/s1431927602101103 ◽

2002 ◽

Vol 8 (S02) ◽

pp. 446-447

Author(s):

M.R. Phillips ◽

S.W. Morgan

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Variable Pressure ◽

Ion Dynamics ◽

Time Resolved ◽

Positive Ion ◽

Scanning Electron

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Skirting: A Limitation for the Performance of X-ray Microanalysis in the Variable Pressure or Environmental Scanning Electron Microscope

Scanning ◽

10.1002/sca.20052 ◽

2007 ◽

Vol 29 (3) ◽

pp. 114-122 ◽

Cited By ~ 7

Author(s):

J. F. Le Berre ◽

G. P. Demopoulos ◽

R. Gauvin

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Environmental Scanning Electron Microscope ◽

Variable Pressure ◽

Environmental Scanning ◽

X Ray ◽

Scanning Electron

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Charge contrast imaging of biomaterials in a variable pressure scanning electron microscope

Journal of Structural Biology ◽

10.1016/j.jsb.2006.04.004 ◽

2006 ◽

Vol 155 (3) ◽

pp. 505-511 ◽

Cited By ~ 7

Author(s):

Peta L. Clode

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Variable Pressure ◽

Contrast Imaging ◽

Scanning Electron

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Improvements to a Gaseous Scintillation Detector for a Variable Pressure Scanning Electron Microscope

Microscopy and Microanalysis ◽

10.1017/s1431927607075873 ◽

2007 ◽

Vol 13 (S02) ◽

Author(s):

OE Evans ◽

JP Craven

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Scintillation Detector ◽

Variable Pressure ◽

Scanning Electron

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Skirting effects in the variable pressure scanning electron microscope: Limitations and improvements

Micron ◽

10.1016/j.micron.2012.05.004 ◽

2013 ◽

Vol 44 ◽

pp. 107-114 ◽

Cited By ~ 9

Author(s):

A. Zoukel ◽

L. Khouchaf ◽

J.Di. Martino ◽

D. Ruch

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Variable Pressure ◽

Scanning Electron

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The reduction of the beam gas interactions in the variable pressure scanning electron microscope with the use of helium gas

Scanning ◽

10.1002/sca.4950220306 ◽

2006 ◽

Vol 22 (3) ◽

pp. 178-181 ◽

Cited By ~ 7

Author(s):

B. Adamiak ◽

C. Mathieu

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Variable Pressure ◽

Helium Gas ◽

Gas Interactions ◽

Scanning Electron

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Charging: a Limitation to Perform X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope

Microscopy and Microanalysis ◽

10.1017/s1431927605502757 ◽

2005 ◽

Vol 11 (S02) ◽

Author(s):

J-F Le Berre ◽

R Gauvin ◽

G P Demopoulos

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Variable Pressure ◽

X Ray ◽

Scanning Electron

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