Reduction in acquisition time of scanning electron microscopy image using complex hysteresis smoothing

Scanning ◽  
2006 ◽  
Vol 26 (3) ◽  
pp. 140-146 ◽  
Author(s):  
Eisaku Oho
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Acquisition Time ◽  
Scanning Electron Microscopy Image ◽  
Electron Microscopy Image ◽  
Microscopy Image ◽  
Scanning Electron

scholarly journals AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Julian Hennies ◽  
José Miguel Serra Lleti ◽  
Nicole L. Schieber ◽  
Rachel M. Templin ◽  
Anna M. Steyer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Scanning Electron Microscopy Image ◽  
Beam Scanning ◽  
Electron Microscopy Image ◽  
Microscopy Image ◽  
Scanning Electron

scholarly journals Scanning electron microscopy image representativeness: morphological data on nanoparticles

2016 ◽  
Vol 265 (1) ◽  
pp. 34-50 ◽  
Author(s):  
KATARZYNA ODZIOMEK ◽  
DANIELA USHIZIMA ◽  
PRZEMYSLAW OBERBEK ◽  
KRZYSZTOF JAN KURZYDŁOWSKI ◽  
TOMASZ PUZYN ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Morphological Data ◽  
Scanning Electron Microscopy Image ◽  
Electron Microscopy Image ◽  
Microscopy Image ◽  
Scanning Electron
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