scholarly journals Quantification of spherical inclusions in the scanning electron microscope using Monte Carlo simulations

Scanning ◽  
2006 ◽  
Vol 17 (4) ◽  
pp. 202-219 ◽  
Author(s):  
Raynald Gauvin ◽  
Pierre Hovington ◽  
Dominique Drouin
Keyword(s):  
Monte Carlo ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Monte Carlo Simulations ◽  
Spherical Inclusions ◽  
Scanning Electron

scholarly journals Direct electron irradiation of DNA in a fully aqueous environment. Damage determination in combination with Monte Carlo simulations

2017 ◽  
Vol 19 (3) ◽  
pp. 1798-1805 ◽  
Author(s):  
Marc Benjamin Hahn ◽  
Susann Meyer ◽  
Maria-Astrid Schröter ◽  
Harald Seitz ◽  
Hans-Jörg Kunte ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Monte Carlo Simulations ◽  
Electron Irradiation ◽  
Plasmid Dna ◽  
Aqueous Environment ◽  
Scanning Electron

We report on a study in which plasmid DNA in water was irradiated with 30 keV electrons generated by a scanning electron microscope and passed through a 100 nm thick Si3N4 membrane.

X-Ray Emission of Porous Materials In The Scanning Electron Microscope Computed Using Monte Carlo Simulations

1997 ◽  
Vol 3 (S2) ◽  
pp. 883-884 ◽  
Author(s):  
Raynald Gauvin
Keyword(s):  
Monte Carlo ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Monte Carlo Simulations ◽  
Porous Materials ◽  
Cross Sections ◽  
Quantitative Methods ◽  
Electron Trajectories ◽  
X Ray ◽  
Scanning Electron

Conventional quantitative X-ray microanalysis in the scanning electron microscope or in the electron microprobe is valid for specimens of bulk homogeneous composition and with flat and polished surfaces. Quantitative methods, using X-ray microanalysis and Monte Carlo simulations of electron trajectories in solids, have been developed for the chemical analysis of spherical inclusions embedded in a matrix and for multilayered specimens. In this paper, the effect of porosity and of the size of the pores are investigated concerning their effect on X-ray emission using Monte Carlo simulation of electron trajectories in solids since porous materials are of great technological importance.This new Monte Carlo program uses elastic Mott cross-sections to compute electron trajectories and the Joy & Luo modification of the continuous Bethe law of energy loss and the details are given elsewhere. This program assumes that all the pores are spherical and have the same size.

Comparative Study of Scanning Ion Microscope and Scanning Electron Microscope Images Using Monte Carlo Simulations

2004 ◽  
Vol 10 (S02) ◽  
pp. 140-141
Author(s):  
Tohru Ishitani ◽  
Kaoru Ohya
Keyword(s):  
Monte Carlo ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Comparative Study ◽  
Monte Carlo Simulations ◽  
Microscope Images ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

scholarly journals Win X-ray, The Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope

2003 ◽  
Vol 9 (S02) ◽  
pp. 32-33 ◽  
Author(s):  
Raynald Gauvin ◽  
Eric Lifshin ◽  
Hendrix Demers ◽  
Paula Horny ◽  
Helen Campbell
Keyword(s):  
Monte Carlo ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Monte Carlo Program ◽  
X Ray ◽  
Scanning Electron
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