Biomedical research applications of scanning electron microscopy: Vols. 1 and 2.: G. M. Hodges and R. C. Hallowes, eds. Academic Press, London - New York - Toronto - Sydney - San Francisco 1979-1980 vol. i (363 pages, 214 figures, isbn 0-12-351001-5) vol.

Yu. A. Rovensky; J. M. Vasiliev

doi:10.1002/sca.4950040413

Biomedical research applications of scanning electron microscopy: Vols. 1 and 2.: G. M. Hodges and R. C. Hallowes, eds. Academic Press, London - New York - Toronto - Sydney - San Francisco 1979-1980 vol. i (363 pages, 214 figures, isbn 0-12-351001-5) vol.

Scanning ◽

10.1002/sca.4950040413 ◽

1981 ◽

Vol 4 (4) ◽

pp. 208-208

Author(s):

Yu. A. Rovensky ◽

J. M. Vasiliev

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

San Francisco ◽

Biomedical Research ◽

Academic Press ◽

Scanning Electron

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Interpreting Micromorphology: Scanning Electron Microscopy . Systematic and Evolutionary Applications. Proceedings of a symposium, Reading, England, Apr. 1970. V. H. Heywood, Ed. Published for the Systematics Association by Academic Press, New York, 1971. x, 332 pp., illus. $19. Systematics Association Special Volume No. 4.

Science ◽

10.1126/science.174.4004.50.a ◽

1971 ◽

Vol 174 (4004) ◽

pp. 50-50

Author(s):

Thomas J. M. Schopf

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Academic Press ◽

Special Volume ◽

Scanning Electron

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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis. Patrick Echlin. Springer, New York; 2009, 330 pages. ISBN 978-0-387-85730-5(Hardcover).

Microscopy and Microanalysis ◽

10.1017/s1431927609991152 ◽

2010 ◽

Vol 16 (3) ◽

pp. 358-359

Author(s):

Iolo ap Gwynn

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Sample Preparation ◽

X Ray ◽

Scanning Electron

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Biological Low-Voltage Scanning Electron Microscopy. Edited by Heide Schatten and James B. Pawley. Springer Science+Business Media, LLC, New York; 2008, 317 pages. ISBN 978-0-387-72970-1; e-ISBN 978-0-387-72972-5

Microscopy and Microanalysis ◽

10.1017/s143192760999095x ◽

2009 ◽

Vol 15 (6) ◽

pp. 564-566

Author(s):

Thomas L. Hayes

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Business Media ◽

Voltage Scanning ◽

Scanning Electron

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GOLDSTEIN, J., NEWBURY, D., JOY, D., LYMAN, C., ECHLIN, P., LIFSHIN, E., SAWYER, L. & MICHAEL, J. 2003. Scanning Electron Microscopy and X-Ray Microanalysis, 3rd ed. xix + 689 pp. New York, Boston, Dordrecht, London, Moscow: Kluwer Academic/Plenum Publishers. Price Euros 76.00, US $75.00, £48.00 (hard covers). ISBN 0 306 47292 9

Geological Magazine ◽

10.1017/s0016756803238838 ◽

2003 ◽

Vol 140 (6) ◽

pp. 728-729 ◽

Cited By ~ 1

Author(s):

R. B. Pearce

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

X Ray ◽

Scanning Electron

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