scholarly journals Examples of Charging Effects on the Spectral Quality of X-ray Microanalysis on a Glass Sample Using the Variable Pressure Scanning Electron Microscope

Scanning ◽  
2007 ◽  
Vol 29 (6) ◽  
pp. 270-279 ◽  
Author(s):  
J. F. Le Berre ◽  
H. Demers ◽  
G. P. Demopoulos ◽  
R. Gauvin
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Glass Sample ◽  
Variable Pressure ◽  
Spectral Quality ◽  
X Ray ◽  
Scanning Electron

scholarly journals Performance of X-ray Microanalysis in the Variable Pressure or Environmental Scanning Electron Microscope

2006 ◽  
Vol 12 (S02) ◽  
pp. 1492-1493 ◽  
Author(s):  
J-F Le Berre ◽  
K Robertson ◽  
R Gauvin ◽  
GP Demopoulos
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Environmental Scanning Electron Microscope ◽  
Variable Pressure ◽  
Environmental Scanning ◽  
X Ray ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Fabrication of Accurate Diamond - Metal Composite Cutting Blade by Electrotyping Method

2006 ◽  
Vol 304-305 ◽  
pp. 57-61
Author(s):  
L.L. Fang ◽  
Bing Lin Zhang ◽  
Ning Yao
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Ph Value ◽  
Photoemission Spectroscopy ◽  
Metal Composite ◽  
X Ray Diffraction ◽  
Electrolytic Solution ◽  
X Ray ◽  
Scanning Electron

In this paper, we report that the experimental results of fabricated diamond-metal composite film. Electrotyping method was used to deposit the thick film. During the deposition, low internal stress electrolytic solution, the electric current density of cathode, PH value, temperature, the distance between cathode and anode, the pretreatment of motherboard cathode were selected simultaneously. It was found that stirring strongly affected the quality of the film. Especially stirring velocity affected the distribution of diamond grains. Scanning electron microscope (SEM), X-ray photoemission spectroscopy (XPS) and X-ray diffraction (XRD) were used to measure the surface morphology, the crystal microstructure, diamond grains distribution and the chemical environment of the film.

scholarly journals Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM)

2017 ◽  
pp. 441-459
Author(s):  
Joseph I. Goldstein ◽  
Dale E. Newbury ◽  
Joseph R. Michael ◽  
Nicholas W. M. Ritchie ◽  
John Henry J. Scott ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Variable Pressure ◽  
X Ray ◽  
Scanning Electron
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