A randomized on–line algorithm for thek–server problem on a line

2006 ◽  
Vol 29 (1) ◽  
pp. 82-104 ◽  
Author(s):  
Béla Csaba ◽  
Sachin Lodha
Keyword(s):  
On Line ◽  
Server Problem

scholarly journals Measuring True Performance of the Work Function Algorithm for Solving the On-line k-Server Problem

2010 ◽  
Vol 18 (4) ◽  
pp. 361 ◽  
Author(s):  
Tomislav Rudec ◽  
Alfonzo Baumgartner ◽  
Robert Manger
Keyword(s):  
Work Function ◽  
On Line ◽  
Server Problem

scholarly journals Work Function Algorithm with a Moving Window for Solving the On-line k-server Problem

2007 ◽  
Vol 15 (4) ◽  
pp. 325 ◽  
Author(s):  
Alfonzo Baumgartner ◽  
Robert Manger ◽  
�eljko Hocenski
Keyword(s):  
Work Function ◽  
Moving Window ◽  
On Line ◽  
Server Problem

ON THE k-TRUCK SCHEDULING PROBLEM

2004 ◽  
Vol 15 (01) ◽  
pp. 127-141 ◽  
Author(s):  
WEIMIN MA ◽  
YINFENG XU ◽  
JANE YOU ◽  
JAMES LIU ◽  
KANLIANG WANG
Keyword(s):  
Lower Bound ◽  
Greedy Algorithm ◽  
Competitive Ratio ◽  
Scheduling Problem ◽  
Competitive Algorithm ◽  
Truck Scheduling ◽  
New Variant ◽  
On Line ◽  
Server Problem ◽  
Better Than

In this paper, some results concerning the k-truck problem are produced. Firstly, the algorithms and their complexity concerning the off-line k-truck problem are discussed. Following that, a lower bound of competitive ratio (1+θ)·k/(θ·k+2) for the on-line k-truck problem is given, where θ is the ratio of cost of the loaded truck and the empty truck on the same distance, and a relevant lower bound for the on-line k-taxi problem followed naturally. Thirdly, based on the Position Maintaining Strategy (PMS), some new results which are slightly better than those of [11] for general cases are obtained. For example, a c-competitive or (c/θ+1/θ+1)-competitive algorithm for the on-line k-truck problem depending on the value of θ, where c is the competitive ratio of some algorithm to a relevant k-server problem, is developed. The Partial-Greedy Algorithm (PG) is used as well to solve this problem on a line with n nodes and is proved to be a (1+(n-k)/θ)-competitive algorithm for this case. Finally, the concepts of the on-line k-truck problem are extended to obtain a new variant: Deeper On-line k-Truck Problem (DTP). We claim that results of PMS for the STP (Standard Truck Problem) hold for the DTP.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Design and calibration of an IVEM for general 3-dimensional imaging of non-diffracting materials

1992 ◽  
Vol 50 (2) ◽  
pp. 1040-1041
Author(s):  
Neil Rowlands ◽  
Jeff Price ◽  
Michael Kersker ◽  
Seichi Suzuki ◽  
Steve Young ◽  
...  
Keyword(s):  
3D Imaging ◽  
Tomographic Reconstruction ◽  
Three Dimensional ◽  
3 Dimensional ◽  
3D Microstructure ◽  
Image Translation ◽  
Digital Correlation ◽  
On Line ◽  
Mechanical Stage ◽  
Projection Angle

Three-dimensional (3D) microstructure visualization on the electron microscope requires that the sample be tilted to different positions to collect a series of projections. This tilting should be performed rapidly for on-line stereo viewing and precisely for off-line tomographic reconstruction. Usually a projection series is collected using mechanical stage tilt alone. The stereo pairs must be viewed off-line and the 60 to 120 tomographic projections must be aligned with fiduciary markers or digital correlation methods. The delay in viewing stereo pairs and the alignment problems in tomographic reconstruction could be eliminated or improved by tilting the beam if such tilt could be accomplished without image translation.A microscope capable of beam tilt with simultaneous image shift to eliminate tilt-induced translation has been investigated for 3D imaging of thick (1 μm) biologic specimens. By tilting the beam above and through the specimen and bringing it back below the specimen, a brightfield image with a projection angle corresponding to the beam tilt angle can be recorded (Fig. 1a).

Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

1986 ◽  
Vol 44 ◽  
pp. 694-695
Author(s):  
G.Y. Fan ◽  
J.M. Cowley
Keyword(s):  
Image Processing ◽  
Pattern Recognition ◽  
Computer Software ◽  
Processing System ◽  
Light Level ◽  
Host Computer ◽  
Low Light ◽  
Image Processing System ◽  
Recent Developments ◽  
On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

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