Distributed Nash equilibrium learning: A second‐order proximal algorithm

2021 ◽  
Author(s):  
Wei Pan ◽  
Yu Lu ◽  
Zehua Jia ◽  
Weidong Zhang
Keyword(s):  
Nash Equilibrium ◽  
Second Order ◽  
Proximal Algorithm

NEWTONIAN MECHANICS AND NASH PLAY

2004 ◽  
Vol 06 (02) ◽  
pp. 181-194 ◽  
Author(s):  
S. D. FLÅM ◽  
J. MORGAN
Keyword(s):  
Nash Equilibrium ◽  
Second Order ◽  
Convergence To Equilibrium ◽  
Newtonian Mechanics ◽  
Order Process ◽  
Natural Conditions ◽  
Important Condition ◽  
Rational Agents ◽  
Second Order Process

Nash equilibrium leaves the impression that each player foresees perfectly and responds optimally. Must human-like, rational agents really acquire both these faculties? This paper argues that in some instances neither is ever needed. For the argument repeated play is modelled here as a constrained, decentralized, second-order process driven by noncoordinated pursuit of better payoffs. Some friction feeds into — and stabilizes — a fairly myopic mode of behavior. Convergence to equilibrium therefore obtains under weak and natural conditions. An important condition is that accumulation of marginal payoffs, along the path of play, yields a sum which is bounded above.

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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