A robust control based solution to the sample-profile estimation problem in fast atomic force microscopy

2005 ◽  
Vol 15 (16) ◽  
pp. 821-837 ◽  
Author(s):  
Srinivasa M. Salapaka ◽  
Tathagata De ◽  
Abu Sebastian
Keyword(s):  
Atomic Force Microscopy ◽  
Robust Control ◽  
Estimation Problem ◽  
Force Microscopy ◽  
Atomic Force ◽  
Profile Estimation

New Approaches for Sample-Profile Estimation for Fast Atomic Force Microscopy

2005 ◽  
Author(s):  
Srinivasa M. Salapaka ◽  
Tathagata De ◽  
Abu Sebastian
Keyword(s):  
Atomic Force Microscopy ◽  
Transfer Function ◽  
Atomic Force Microscope ◽  
Estimation Problem ◽  
Experimental Results ◽  
Force Microscopy ◽  
New Approaches ◽  
Atomic Force ◽  
Profile Estimation

The Atomic Force Microscope (AFM) is a powerful tool for imaging and manipulating matter at the nanoscale. The sample-profile estimation problem in Atomic Force Microscopy is addressed using H∞ control. A new estimate signal for the sample profile is proposed and it is proved that this signal tracks perfectly the profile signal. i.e., the transfer function between the profile signal and the estimate signal is one. Experimental results are presented to corroborate these results.

Robust Control of Atomic Force Microscopy

Mechatronics ◽  
2013 ◽  
pp. 103-132
Author(s):  
Bilin Aksun Güvenç ◽  
Serkan Neci̇poğlu ◽  
Burak Demi̇rel ◽  
Levent Güvenç
Keyword(s):  
Atomic Force Microscopy ◽  
Robust Control ◽  
Force Microscopy ◽  
Atomic Force

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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