High-resolution secondary ion mass spectrometry depth profiling of nanolayers

2012 ◽  
Vol 26 (19) ◽  
pp. 2224-2230 ◽  
Author(s):  
Sergey V. Baryshev ◽  
Alexander V. Zinovev ◽  
C. Emil Tripa ◽  
Michael J. Pellin ◽  
Qing Peng ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

High-resolution secondary ion mass spectrometry depth profiling of superconducting thin films

1998 ◽  
Vol 317 (1-2) ◽  
pp. 237-240 ◽  
Author(s):  
N.J Montgomery ◽  
J.L MacManus-Driscoll ◽  
D.S McPhail ◽  
R.J Chater ◽  
B Moeckly ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
High Resolution ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Superconducting Thin Films ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Round-robin test for the measurement of layer thickness of multilayer films by secondary ion mass spectrometry depth profiling

2017 ◽  
Vol 49 (11) ◽  
pp. 1057-1063 ◽  
Author(s):  
Kyung Joong Kim ◽  
Jong Shik Jang ◽  
Joe Bennett ◽  
David Simons ◽  
Mario Barozzi ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Layer Thickness ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Multilayer Films ◽  
Round Robin ◽  
Round Robin Test ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Imaging and 3D Elemental Characterization of Intact Bacterial Spores by High-Resolution Secondary Ion Mass Spectrometry

2008 ◽  
Vol 80 (15) ◽  
pp. 5986-5992 ◽  
Author(s):  
Sutapa Ghosal ◽  
Stewart J. Fallon ◽  
Terrance J. Leighton ◽  
Katherine E. Wheeler ◽  
Michael J. Kristo ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Secondary Ion Mass Spectrometry ◽  
Bacterial Spores ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Elemental Characterization
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