An investigation of cobalt oxide based nanocrystalline thin films by secondary ion mass spectrometry

Simona Barison; Davide Barreca; Sergio Daolio; Monica Fabrizio; Eugenio Tondello

doi:10.1002/rcm.397

An investigation of cobalt oxide based nanocrystalline thin films by secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.397 ◽

2001 ◽

Vol 15 (17) ◽

pp. 1621-1624 ◽

Cited By ~ 3

Author(s):

Simona Barison ◽

Davide Barreca ◽

Sergio Daolio ◽

Monica Fabrizio ◽

Eugenio Tondello

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Cobalt Oxide ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Nanocrystalline Thin Films

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Tracer Diffusion Coefficients of Li Ions in LixMn2O4 Thin Films Observed by Isotope Exchange Secondary Ion Mass Spectrometry

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.0c06375 ◽

2020 ◽

Vol 124 (42) ◽

pp. 22981-22992

Author(s):

Naoaki Kuwata ◽

Gen Hasegawa ◽

Daiki Maeda ◽

Norikazu Ishigaki ◽

Takamichi Miyazaki ◽

...

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Diffusion Coefficients ◽

Isotope Exchange ◽

Secondary Ion Mass Spectrometry ◽

Tracer Diffusion ◽

Ion Mass Spectrometry ◽

Tracer Diffusion Coefficients ◽

Secondary Ion

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Static secondary ion mass spectrometry analysis of UV photopolymerization in diacetylene thin films

Langmuir ◽

10.1021/la00059a010 ◽

1991 ◽

Vol 7 (11) ◽

pp. 2454-2459 ◽

Cited By ~ 5

Author(s):

Paula A. Cornelio-Clark ◽

Joseph A. Gardella

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Secondary Ion Mass Spectrometry ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Determination of concentration in depth profiles of thin films with Secondary Ion Mass Spectrometry

Vacuum ◽

10.1016/s0042-207x(76)81117-7 ◽

1976 ◽

Vol 26 (3) ◽

pp. 130

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry

Thin Solid Films ◽

10.1016/j.tsf.2011.04.018 ◽

2011 ◽

Vol 519 (18) ◽

pp. 6183-6189 ◽

Cited By ~ 4

Author(s):

Karl E. Mayerhofer ◽

Jakob Heier ◽

Ylenia Maniglio ◽

Beat Andreas Keller

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Dimensional Analysis ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Time Of Flight ◽

Organic Thin Films ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Three-Dimensional Information on the Phase Domain Structure of Thin Films of Polymer Blends Revealed by Secondary Ion Mass Spectrometry

Macromolecular Rapid Communications ◽

10.1002/1521-3927(20010701)22:11<829::aid-marc829>3.0.co;2-8 ◽

2001 ◽

Vol 22 (11) ◽

pp. 829-834 ◽

Cited By ~ 25

Author(s):

Andrzej Bernasik ◽

Jakub Rysz ◽

Andrzej Budkowski ◽

Kazimierz Kowalski ◽

Józef Camra ◽

...

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Polymer Blends ◽

Domain Structure ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Phase Domain ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Nitrogen incorporation and trace element analysis of nanocrystalline diamond thin films by secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.581786 ◽

1999 ◽

Vol 17 (4) ◽

pp. 1135-1140 ◽

Cited By ~ 11

Author(s):

D. Zhou ◽

F. A. Stevie ◽

L. Chow ◽

J. McKinley ◽

H. Gnaser ◽

...

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Trace Element ◽

Secondary Ion Mass Spectrometry ◽

Trace Element Analysis ◽

Nanocrystalline Diamond ◽

Element Analysis ◽

Nitrogen Incorporation ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Angewandte Chemie International Edition in English ◽

10.1002/anie.199410231 ◽

1994 ◽

Vol 33 (10) ◽

pp. 1023-1043 ◽

Cited By ~ 329

Author(s):

Alfred Benninghoven

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Organic Surfaces ◽

Secondary Ion ◽

Inorganic And Organic

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Nanoconfinement of Ionic Liquid and Polymers in Supported Thin Films: A Time-of-Flight Secondary Ion Mass Spectrometry Study of Surface Diffusion

The Journal of Physical Chemistry C ◽

10.1021/jp404816t ◽

2013 ◽

Vol 117 (41) ◽

pp. 21281-21287 ◽

Cited By ~ 2

Author(s):

Ryutaro Souda

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Ionic Liquid ◽

Surface Diffusion ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry ◽

10.1002/(sici)1097-0231(19981015)12:19<1303::aid-rcm330>3.0.co;2-7 ◽

1998 ◽

Vol 12 (19) ◽

pp. 1303-1312 ◽

Cited By ~ 185

Author(s):

Greg Gillen ◽

Sonya Roberson

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Organic Thin Films ◽

Preliminary Evaluation ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Evaluation of sputtering induced surface roughness development of Ni/Cu multilayers thin films by Time-of-Flight Secondary Ion Mass Spectrometry depth profiling with different energies O2+ ion bombardment

Thin Solid Films ◽

10.1016/j.tsf.2018.10.049 ◽

2019 ◽

Vol 669 ◽

pp. 188-197

Author(s):

X.L. Yan ◽

M.M. Duvenhage ◽

J.Y. Wang ◽

H.C. Swart ◽

J.J. Terblans

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Surface Roughness ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

Secondary Ion

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