Electron Energy-Loss Spectroscopy of Spatial Nonlocality and Quantum Tunneling Effects in the Bright and Dark Plasmon Modes of Gold Nanosphere Dimers

2018 ◽  
Vol 1 (1) ◽  
pp. 1800016 ◽  
Author(s):  
Qiang Zhang ◽  
Xiangbin Cai ◽  
Xiang Yu ◽  
Susana Carregal-Romero ◽  
Wolfgang J. Parak ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Quantum Tunneling ◽  
Spatial Nonlocality ◽  
Gold Nanosphere ◽  
Electron Energy Loss ◽  
Plasmon Modes

scholarly journals Effect of multipole excitations in electron energy-loss spectroscopy of surface plasmon modes in silver nanowires

2014 ◽  
Vol 116 (22) ◽  
pp. 223101 ◽  
Author(s):  
Xiuli Zhou ◽  
Anton Hörl ◽  
Andreas Trügler ◽  
Ulrich Hohenester ◽  
Theodore B. Norris ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Surface Plasmon ◽  
Electron Energy Loss Spectroscopy ◽  
Silver Nanowires ◽  
Electron Energy Loss ◽  
Plasmon Modes

scholarly journals Independent engineering of individual plasmon modes in plasmonic dimers with conductive and capacitive coupling

Nanophotonics ◽  
2019 ◽  
Vol 9 (3) ◽  
pp. 623-632 ◽  
Author(s):  
Vlastimil Křápek ◽  
Andrea Konečná ◽  
Michal Horák ◽  
Filip Ligmajer ◽  
Michael Stöger-Pollach ◽  
...  
Keyword(s):  
Energy Loss ◽  
Numerical Simulations ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Near Field ◽  
Capacitive Coupling ◽  
Plasmon Resonances ◽  
Electron Energy Loss ◽  
Spectroscopy Optical ◽  
Plasmon Modes

AbstractWe revisit plasmon modes in nanoparticle dimers with conductive or insulating junction resulting in conductive or capacitive coupling. In our study, which combines electron energy loss spectroscopy, optical spectroscopy, and numerical simulations, we show the coexistence of strongly and weakly hybridised modes. While the properties of the former ones strongly depend on the nature of the junction, the properties of the latter ones are nearly unaffected. This opens up a prospect for independent engineering of individual plasmon modes in a single plasmonic antenna. In addition, we show that Babinet’s principle allows to engineer the near field of plasmon modes independent of their energy. Finally, we demonstrate that combined electron energy loss imaging of a plasmonic antenna and its Babinet-complementary counterpart allows to reconstruct the distribution of both electric and magnetic near fields of localised plasmon resonances supported by the antenna, as well as charge and current antinodes of related charge oscillations.

Data Acquisition and Handling Unit for a Quantitative Use of Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 232-233 ◽  
Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Single Channel ◽  
Detection System ◽  
Surface Barrier ◽  
Solid State Detector ◽  
Electrostatic Mirror ◽  
Electron Energy Loss

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.

Trends in Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 228-229
Author(s):  
C. Colliex ◽  
P. Trebbia
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Analytical Technique ◽  
Recent Developments ◽  
Quantitative Results ◽  
Electron Microscopes ◽  
Electron Energy Loss ◽  
Primary Electrons

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.

Signal/Noise Ratio and Elemental Detectivity by Eels

1982 ◽  
Vol 40 ◽  
pp. 488-489
Author(s):  
R. F. Egerton
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Elemental Analysis ◽  
Electron Energy Loss Spectroscopy ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Signal Noise ◽  
Characteristic Signal ◽  
Noise Ratio ◽  
Electron Energy Loss

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

Quantitative Electron Energy Loss Mapping

1985 ◽  
Vol 43 ◽  
pp. 404-405
Author(s):  
R.D. Leapman ◽  
C.R. Swyt
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Elemental Concentration ◽  
Core Loss ◽  
Elemental Distribution ◽  
Electron Energy Loss

The intensity of a characteristic electron energy loss spectroscopy (EELS) image does not, in general, directly reflect the elemental concentration. In fact, the raw core loss image can give a misleading impression of the elemental distribution. This is because the measured core edge signal depends on the amount of plural scattering which can vary significantly from region to region in a sample. Here, we show how the method for quantifying spectra due to Egerton et al. can be extended to maps.

Stopping-power determination for compound by EELS

1994 ◽  
Vol 52 ◽  
pp. 948-949 ◽  
Author(s):  
David C. Joy ◽  
Suichu Luo ◽  
John R. Dunlap ◽  
Dick Williams ◽  
Siqi Cao
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Average Energy ◽  
Stopping Power ◽  
Accurate Information ◽  
Power Calculation ◽  
Coulomb Collisions ◽  
Electron Energy Loss

In Physics, Chemistry, Materials Science, Biology and Medicine, it is very important to have accurate information about the stopping power of various media for electrons, that is the average energy loss per unit pathlength due to inelastic Coulomb collisions with atomic electrons of the specimen along their trajectories. Techniques such as photoemission spectroscopy, Auger electron spectroscopy, and electron energy loss spectroscopy have been used in the measurements of electron-solid interaction. In this paper we present a comprehensive technique which combines experimental and theoretical work to determine the electron stopping power for various materials by electron energy loss spectroscopy (EELS ). As an example, we measured stopping power for Si, C, and their compound SiC. The method, results and discussion are described briefly as below.The stopping power calculation is based on the modified Bethe formula at low energy:where Neff and Ieff are the effective values of the mean ionization potential, and the number of electrons participating in the process respectively. Neff and Ieff can be obtained from the sum rule relations as we discussed before3 using the energy loss function Im(−1/ε).

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