scholarly journals Simulating noisy variational quantum eigensolver with local noise models

2021 ◽  
Author(s):  
Jinfeng Zeng ◽  
Zipeng Wu ◽  
Chenfeng Cao ◽  
Chao Zhang ◽  
Shi‐Yao Hou ◽  
...  
Keyword(s):  
Noise Models

scholarly journals 1/f Noise Modelling and Characterization for CMOS Quanta Image Sensors

Sensors ◽  
2019 ◽  
Vol 19 (24) ◽  
pp. 5459
Author(s):  
Wei Deng ◽  
Eric R. Fossum
Keyword(s):  
Analog Circuits ◽  
Image Sensor ◽  
Image Sensors ◽  
Correlated Double Sampling ◽  
Cmos Image Sensors ◽  
Source Follower ◽  
Cmos Analog Circuits ◽  
Different Origins ◽  
Noise Models ◽  
Fitting Model

This work fits the measured in-pixel source-follower noise in a CMOS Quanta Image Sensor (QIS) prototype chip using physics-based 1/f noise models, rather than the widely-used fitting model for analog designers. This paper discusses the different origins of 1/f noise in QIS devices and includes correlated double sampling (CDS). The modelling results based on the Hooge mobility fluctuation, which uses one adjustable parameter, match the experimental measurements, including the variation in noise from room temperature to –70 °C. This work provides useful information for the implementation of QIS in scientific applications and suggests that even lower read noise is attainable by further cooling and may be applicable to other CMOS analog circuits and CMOS image sensors.

scholarly journals Noise and Breakdown Characterization of SPAD Detectors with Time-Gated Photon-Counting Operation

Sensors ◽  
2021 ◽  
Vol 21 (16) ◽  
pp. 5287
Author(s):  
Hiwa Mahmoudi ◽  
Michael Hofbauer ◽  
Bernhard Goll ◽  
Horst Zimmermann
Keyword(s):  
Breakdown Voltage ◽  
Single Photon ◽  
Photon Counting ◽  
Low Noise ◽  
Dark Count ◽  
Fully Integrated ◽  
Trade Offs ◽  
And Performance ◽  
Noise Models

Being ready-to-detect over a certain portion of time makes the time-gated single-photon avalanche diode (SPAD) an attractive candidate for low-noise photon-counting applications. A careful SPAD noise and performance characterization, however, is critical to avoid time-consuming experimental optimization and redesign iterations for such applications. Here, we present an extensive empirical study of the breakdown voltage, as well as the dark-count and afterpulsing noise mechanisms for a fully integrated time-gated SPAD detector in 0.35-μm CMOS based on experimental data acquired in a dark condition. An “effective” SPAD breakdown voltage is introduced to enable efficient characterization and modeling of the dark-count and afterpulsing probabilities with respect to the excess bias voltage and the gating duration time. The presented breakdown and noise models will allow for accurate modeling and optimization of SPAD-based detector designs, where the SPAD noise can impose severe trade-offs with speed and sensitivity as is shown via an example.

Noise in Integrate-and-Fire Neurons: From Stochastic Input to Escape Rates

2000 ◽  
Vol 12 (2) ◽  
pp. 367-384 ◽  
Author(s):  
Hans E. Plesser ◽  
Wulfram Gerstner
Keyword(s):  
Membrane Potential ◽  
Diffusion Approximation ◽  
Hazard Function ◽  
Time Dependent ◽  
Integrate And Fire ◽  
Probability Current ◽  
Periodic Input ◽  
Stochastic Input ◽  
Free Membrane ◽  
Noise Models

We analyze the effect of noise in integrate-and-fire neurons driven by time-dependent input and compare the diffusion approximation for the membrane potential to escape noise. It is shown that for time-dependent subthreshold input, diffusive noise can be replaced by escape noise with a hazard function that has a gaussian dependence on the distance between the (noise-free) membrane voltage and threshold. The approximation is improved if we add to the hazard function a probability current proportional to the derivative of the voltage. Stochastic resonance in response to periodic input occurs in both noise models and exhibits similar characteristics.

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