EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan
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2015 ◽
Vol 229
(2)
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pp. 119-130
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2013 ◽
Vol 432
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pp. 179-184
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2008 ◽
Vol 2045
(1)
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pp. 62-67
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2017 ◽
Vol 66
(3)
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pp. 641-650
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