Effect of Field Stress Variance on Test to Field Correlation in Accelerated Reliability Demonstration Testing

2014 ◽  
Vol 31 (5) ◽  
pp. 783-788 ◽  
Author(s):  
Andre Kleyner
Keyword(s):  
Field Stress ◽  
Field Correlation ◽  
Stress Variance

scholarly journals Study of electric field stress on the surface contour and at the triple junction in three phase GIS with FGM spacer under the depression defect

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Janaki Pakalapati ◽  
Venkata N. Kumar Gundavarapu ◽  
Deepak Chowdary Duvvada ◽  
Sravana Kumar Bali
Keyword(s):  
Electric Field ◽  
Triple Junction ◽  
Dielectric Strength ◽  
Functionally Graded ◽  
Uniform Electric Field ◽  
Filler Materials ◽  
Field Stress ◽  
As Doping ◽  
Three Phase ◽  
Graded Material

AbstractNow days, the establishment of spacers is in wide usage in three-phase Gas Insulated Busduct (GIB) for providing mechanical support and better insulation to the conductors. The region of the intersection of SF6 gas, enclosure end and the spacer is one of the weakest links in GIB, so the major concentration is done on minimization of electric field stress at this junction by using Functionally Graded Material (FGM) technique. The other incidents of insulation failures are due to several defects like depression, delamination etc. reduces the dielectric strength of the spacers. In this paper, an FGM post type spacer has been designed for a three-phase GIB under depression and further electric field stress at Triple Junction (TJ) is reduced by introducing a metal insert (MI) nearer to the TJ. Several filler materials are used as doping materials for obtaining different permittivity values using FGM technique to achieve uniform electric field stress. Simulation is carried out for the designed spacer at various operating voltages with different types of FGM gradings. The effect of depression with different dimensions and positions is analyzed before and after inserting MI to the FGM post type spacer in three-phase GIB.

Phase and Amplitude Retrieval in Ghost Diffraction from Field-Correlation Measurements

2006 ◽  
Vol 96 (18) ◽  
Author(s):  
Riccardo Borghi ◽  
Franco Gori ◽  
Massimo Santarsiero
Keyword(s):  
Field Correlation

Oxide wearout phenomena of ultrathin SiO2 film during high-field stress

1992 ◽  
Vol 28 (16) ◽  
pp. 1516 ◽  
Author(s):  
H. Fukuda ◽  
M. Yasuda ◽  
T. Iwabuchi
Keyword(s):  
High Field ◽  
Sio2 Film ◽  
Field Stress
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