scholarly journals Large Electric‐Field‐Induced Strain Close to the Surface in Barium Titanate Studied by Atomic‐Scale In Situ Electron Microscopy

2019 ◽  
Vol 14 (1) ◽  
pp. 1900488 ◽  
Author(s):  
Yukio Sato ◽  
Ryuki Miyauchi ◽  
Mai Aoki ◽  
Syota Fujinaka ◽  
Ryo Teranishi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Barium Titanate ◽  
Electric Field ◽  
Atomic Scale ◽  
Large Electric Field ◽  
In Situ Electron Microscopy ◽  
Electric Field Induced Strain

Multimodal Optical Nanoprobe for Advanced In-Situ Electron Microscopy

2012 ◽  
Vol 20 (6) ◽  
pp. 32-37 ◽  
Author(s):  
Y. Zhu ◽  
M. Milas ◽  
M.-G. Han ◽  
J.D. Rameau ◽  
M. Sfeir
Keyword(s):  
Electron Microscopy ◽  
Driving Forces ◽  
Atomic Scale ◽  
Magnetic Domains ◽  
Photovoltaic Devices ◽  
Electromagnetic Devices ◽  
In Situ Electron Microscopy ◽  
Electric And Magnetic Fields ◽  
Anions And Cations

In-situ electron microscopy has gained considerable attention in recent years. It provides a “live” view of a material or device under study at various length scales. For example, by heating or cooling a sample one can study structural change at the atomic scale to understand the driving forces and mechanisms of phase transitions. By applying electric and magnetic fields on a ferroelectric or magnetic architecture in operation, one can directly observe how electric and magnetic domains switch, how anions and cations shift their positions, and how spins change their configuration across a domain wall, aiding the development of better electromagnetic devices. In the study of photovoltaic devices and junctions, a major challenge is to directly correlate light-induced electric currents with local structural inhomogeneities and dynamics. Such a capability would allow us to evaluate the performance of individual p-n junctions and to improve optoelectronic efficiency.

scholarly journals Atomic-Scale Insights into Nickel Exsolution on LaNiO3 Catalysts via In Situ Electron Microscopy

2021 ◽  
Author(s):  
Pengfei Cao ◽  
Pengyi Tang ◽  
Maged F. Bekheet ◽  
Hongchu Du ◽  
Luyan Yang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Atomic Scale ◽  
In Situ Electron Microscopy

scholarly journals Fabrication of a liquid cell for in situ transmission electron microscopy

Microscopy ◽  
2020 ◽  
Author(s):  
Xiaoguang Li ◽  
Kazutaka Mitsuishi ◽  
Masaki Takeguchi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cost Effective ◽  
Production Method ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Liquid Cell ◽  
Si Wafer

Abstract Liquid cell transmission electron microscopy (LCTEM) enables imaging of dynamic processes in liquid with high spatial and temporal resolution. The widely used liquid cell (LC) consists of two stacking microchips with a thin wet sample sandwiched between them. The vertically overlapped electron-transparent membrane windows on the microchips provide passage for the electron beam. However, microchips with imprecise dimensions usually cause poor alignment of the windows and difficulty in acquiring high-quality images. In this study, we developed a new and efficient microchip fabrication process for LCTEM with a large viewing area (180 µm × 40 µm) and evaluated the resultant LC. The new positioning reference marks on the surface of the Si wafer dramatically improve the precision of dicing the wafer, making it possible to accurately align the windows on two stacking microchips. The precise alignment led to a liquid thickness of 125.6 nm close to the edge of the viewing area. The performance of our LC was demonstrated by in situ transmission electron microscopy imaging of the dynamic motions of 2-nm Pt particles. This versatile and cost-effective microchip production method can be used to fabricate other types of microchips for in situ electron microscopy.

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