The spatial distribution of silicon NCs and erbium ion clusters by simultaneous high-resolution energy filtered and Z-contrast STEM and transmission electron tomography

2011 ◽  
Vol 8 (3) ◽  
pp. 1038-1043 ◽  
Author(s):  
Xiongyao Wang ◽  
Peng Li ◽  
Marek Malac ◽  
Ross Lockwood ◽  
Al Meldrum
Keyword(s):  
Spatial Distribution ◽  
High Resolution ◽  
Electron Tomography ◽  
Ion Clusters ◽  
Transmission Electron ◽  
Erbium Ion ◽  
Z Contrast

The Creation and Annealing of Heavy Ion Damage in Silicon

1987 ◽  
Vol 93 ◽  
Author(s):  
L. M. Howe ◽  
M. H. Rainville
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Distribution ◽  
High Resolution ◽  
Heavy Ion ◽  
High Energy ◽  
Transmission Electron ◽  
Ion Damage ◽  
Deposited Energy ◽  
Microscopy Techniques

ABSTRACTHigh resolution transmission electron microscopy techniques have been used to obtain information on the contrast, spatial distribution, size and annealing behaviour of the damaged regions produced within individual collision cascades by heavy ion (As, Sb and Bi) bombardment (10–120 KeV) of silicon with 1.0 × 1011 – 6.0 × 1011 ions cm−2. The fraction of the theoretical cascade volume occupied by a heavily damaged region steadily increased as the average deposited energy density within the cascade increased. At high energy densities, the visible damage produced in the main cascade consisted of a single, isolated damaged region. With decreasing values of (i.e. increasing ion implant energies), there was an increasing tendency for multiple damaged regions to be produced within the main cascade.

3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography

2012 ◽  
Vol 186 ◽  
pp. 41-44
Author(s):  
Władysław Osuch ◽  
Adam Kruk ◽  
Grzegorz Michta ◽  
Aleksandra Czyrska-Filemonowicz
Keyword(s):  
Spatial Distribution ◽  
3D Imaging ◽  
Electron Tomography ◽  
Electron Diffraction Analysis ◽  
Low Alloy Steel ◽  
Detailed Characterization ◽  
Transmission Electron ◽  
Strengthening Particles ◽  
Meso Scale

The electron tomography and transmission electron microscopy studies of the carbides in the 0.5Cr-0.5Mo-0.25V (13HMF) low-alloy steel after service during 160 000 h at 540 °C were carried out. Identification of the carbides was performed by means of electron diffraction analysis. Meso-scale tomography technique, mainly FIB/SEM tomography, was used for detailed characterization of spatial distribution and metrology of the carbides in 13HMF steel. The results achieved confirm the ability of FIB tomography to get 3D reconstruction of internal microstructure of steel as well as to obtain information about the shape and spatial distribution of carbides.

TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System

2012 ◽  
Vol 590 ◽  
pp. 9-12 ◽  
Author(s):  
Tamara Mekhantseva ◽  
Oleg Voitenko ◽  
Ilya Smirnov ◽  
Evgeny Pustovalov ◽  
Vladimir Plotnikov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Amorphous Alloys ◽  
Electron Tomography ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
High Resolution Images ◽  
Electron Energy Loss ◽  
Tomography Analysis

This paper covers the analysis of amorphous alloys CoP-CoNiP system by means of high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy and electron tomography. The last years have seen a sufficient progress in the analysis of nanomaterials structure with the help of high resolution tomography. This progress was motivated by the development of microscopes equipped with aberration correctors and specialized sample holders which allow reaching the tilts angles up to ±80°. The opportunities delivered by the method of electron tomography sufficiently grow when producing high resolution images and using chemical analysis, such as X-Ray energy-dispersive microanalysis and electron energy loss spectroscopy (EELS).

Three-Dimensional Structure of Helical and Zigzagged Nanowires Using Electron Tomography

2008 ◽  
Vol 1144 ◽  
Author(s):  
Han Sung Kim ◽  
Yoon Myung ◽  
Chang Hyun Kim ◽  
Seung Yong Bae ◽  
Jae-Pyoung Ahn ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Tomography ◽  
Three Dimensional ◽  
Helical Structure ◽  
Axial Direction ◽  
Dimensional Structure ◽  
Gan Nanowires ◽  
Transmission Electron

ABSTRACTElectron tomography and high-resolution transmission electron microscopy were used to characterize the unique three-dimensional structures of helical or zigzagged GaN, ZnGa2O4 and Zn2SnO4 nanowires. The helical GaN nanowires adopt a helical structure that consists of six equivalent <0-111> growth directions with the axial [0001] direction. The ZnGa2O4 nanosprings have four equivalent <011> growth directions with the [001] axial direction. The zigzagged Zn2SnO4 nanowires consisted of linked rhombohedrons structure having the side edges matched to the <011> direction, and the [111] axial direction.

scholarly journals Recent Advances in Electron Tomography: TEM and HAADF-STEM Tomography for Materials Science and Semiconductor Applications

2005 ◽  
Vol 11 (5) ◽  
pp. 378-400 ◽  
Author(s):  
Christian Kübel ◽  
Andreas Voigt ◽  
Remco Schoenmakers ◽  
Max Otten ◽  
David Su ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Structural Information ◽  
Electron Tomography ◽  
Semiconductor Devices ◽  
Three Dimensional ◽  
Crystalline Materials ◽  
Transmission Electron ◽  
Stem Tomography

Electron tomography is a well-established technique for three-dimensional structure determination of (almost) amorphous specimens in life sciences applications. With the recent advances in nanotechnology and the semiconductor industry, there is also an increasing need for high-resolution three-dimensional (3D) structural information in physical sciences. In this article, we evaluate the capabilities and limitations of transmission electron microscopy (TEM) and high-angle-annular-dark-field scanning transmission electron microscopy (HAADF-STEM) tomography for the 3D structural characterization of partially crystalline to highly crystalline materials. Our analysis of catalysts, a hydrogen storage material, and different semiconductor devices shows that features with a diameter as small as 1–2 nm can be resolved in three dimensions by electron tomography. For partially crystalline materials with small single crystalline domains, bright-field TEM tomography provides reliable 3D structural information. HAADF-STEM tomography is more versatile and can also be used for high-resolution 3D imaging of highly crystalline materials such as semiconductor devices.

scholarly journals Transmission electron microscopy as an important tool for characterization of zeolite structures

2018 ◽  
Vol 5 (11) ◽  
pp. 2836-2855 ◽  
Author(s):  
W. Wan ◽  
J. Su ◽  
X. D. Zou ◽  
T. Willhammar
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Electron Tomography ◽  
Structure Characterization ◽  
Transmission Electron ◽  
High Resolution Tem

This review presents various TEM techniques including electron diffraction, high-resolution TEM and scanning TEM imaging, and electron tomography and their applications for structure characterization of zeolite materials.

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