Impurity and Thickness Effects on the Cyclotron Resonance Linewidth of Electrons in Si Inversion Layers
1985 ◽
Vol 18
(7)
◽
pp. 1495-1501
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1986 ◽
Vol 170
(1-2)
◽
pp. A226
◽
1986 ◽
Vol 60
(6)
◽
pp. 525-526
◽
1980 ◽
Vol 102
(2)
◽
pp. K81-K83
◽
1981 ◽
Vol 40
(10)
◽
pp. 947-949
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