scholarly journals Local Structure of the Impurity Site in Nd:LaF 3 by X‐Ray Fluorescence Holography

2020 ◽  
Vol 257 (11) ◽  
pp. 2000310
Author(s):  
Jens Rüdiger Stellhorn ◽  
Shinya Hosokawa ◽  
Naohisa Happo ◽  
Kouichi Hayashi ◽  
Tomohiro Matsushita ◽  
...  
Keyword(s):  
1987 ◽  
Vol 104 ◽  
Author(s):  
F. Sette ◽  
S. J. Pearton ◽  
J. M. Poate ◽  
J. E. Rowe

ABSTRACTWe discuss Extended X-ray Absorption Fine Structure (EXAFS) experiments on impurities in semiconductors. The local structure of the impurity site is determined for the first, second and third neighbor shells. These studies are carried out on absorption edges in the soft x-ray region using a novel fluorescence detection scheme which reveals improved detection sensitivity when compared with more standard electron Auger yield methods. The higher detection sensitivity allows structural studies at atomic densities as low as 1018 at/cm3 and this technique is used to study the local structure of P and S impurities in GaAs and of S in Alx Gal−x, As at concentrations of 1019–1020 at/cm3. The P atoms are substitutional on As sites, and a breathing relaxation of the P first shell Ga atoms is responsible for a P-Ga distance of 2.38Å, which is 0.07Å shorter than the As-Ga distance in GaAs(2.45Å). No detectable relaxation is observed in the P second and third atomic shells. In S-doped GaAs we find two different populations of S-Ga bonds with nearly equal intensity and both with S located on the As sub-lattice. These findings indicate two different configurations of substitutional S in GaAs. The coexistence of two similarly populated, charge compensating configurations is the first structural evidence which allows us to explain the observation that in n-doped GaAs the electrical activity of donors is lower than the atomic concentration. Finally, we present experimental results on S impurities in AlxGal−x, As (0.2<x<0.5). In this system, at the Al concentrations we studied, the S impurities are bound only to Al and not to Ga atoms. We report the formation of an extended complex which is discussed in connection with the structural identification of DX centers in these materials.


Author(s):  
G.E. Ice

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.


2019 ◽  
Author(s):  
Jisue Moon ◽  
Carter Abney ◽  
Dmitriy Dolzhnikov ◽  
James M. Kurley ◽  
Kevin A. Beyer ◽  
...  

The local structure of dilute CrCl<sub>3</sub> in a molten MgCl<sub>2</sub>:KCl salt was investigated by <i>in situ</i> x-ray absorption spectroscopy (XAS) at temperatures from room temperature to 800<sup>o</sup>C. This constitutes the first experiment where dilute Cr speciation is explored in a molten chloride salt, ostensibly due to the compounding challenges arising from a low Cr concentration in a matrix of heavy absorbers at extreme temperatures. CrCl<sub>3</sub> was confirmed to be the stable species between 200 and 500<sup>o</sup>C, while mobility of metal ions at higher temperature (>700<sup>o</sup>C) prevented confirmation of the local structure.


Symmetry ◽  
2021 ◽  
Vol 13 (8) ◽  
pp. 1315
Author(s):  
Takafumi Miyanaga

X-ray absorption fine structure (XAFS) is a powerful technique used to analyze a local electronic structure, local atomic structure, and structural dynamics. In this review, I present examples of XAFS that apply to the local structure and dynamics of functional materials: (1) structure phase transition in perovskite PbTiO3 and magnetic FeRhPd alloys; (2) nano-scaled fluctuations related to their magnetic properties in Ni–Mn alloys and Fe/Cr thin films; and (3) the Debye–Waller factors related to the chemical reactivity for catalysis in polyanions and ligand exchange reaction. This study shows that the local structure and dynamics are related to the characteristic function of the materials.


Materials ◽  
2021 ◽  
Vol 14 (15) ◽  
pp. 4061
Author(s):  
Yongtao Li ◽  
Liqing Liu ◽  
Dehao Wang ◽  
Hongguang Zhang ◽  
Xuemin He ◽  
...  

BiFeO3 is considered as a single phase multiferroic. However, its magnetism is very weak. We study the magnetic properties of BiFeO3 by Cu and (Cu, Zn). Polycrystalline samples Bi(Fe0.95Cu0.05)O3 and BiFe0.95(Zn0.025Cu0.025)O3 are prepared by the sol-gel method. The magnetic properties of BiFe0.95(Zn0.025Cu0.025)O3 are greater than that of BiFeO3 and Bi(Fe0.95Cu0.05)O3. The analyses of X-ray absorption fine structure data show that the doped Cu atoms well occupy the sites of the Fe atoms. X-ray absorption near edge spectra data confirm that the valence state of Fe ions does not change. Cu and Zn metal ion co-doping has no impact on the local structure of the Fe and Bi atoms. The modification of magnetism by doping Zn can be understood by the view of the occupation site of non-magnetically active Zn2+.


2010 ◽  
Vol 43 (2) ◽  
pp. 227-236 ◽  
Author(s):  
Leandro M. Acuña ◽  
Diego G. Lamas ◽  
Rodolfo O. Fuentes ◽  
Ismael O. Fábregas ◽  
Márcia C. A. Fantini ◽  
...  

The local atomic structures around the Zr atom of pure (undoped) ZrO2nanopowders with different average crystallite sizes, ranging from 7 to 40 nm, have been investigated. The nanopowders were synthesized by different wet-chemical routes, but all exhibit the high-temperature tetragonal phase stabilized at room temperature, as established by synchrotron radiation X-ray diffraction. The extended X-ray absorption fine structure (EXAFS) technique was applied to analyze the local structure around the Zr atoms. Several authors have studied this system using the EXAFS technique without obtaining a good agreement between crystallographic and EXAFS data. In this work, it is shown that the local structure of ZrO2nanopowders can be described by a model consisting of two oxygen subshells (4 + 4 atoms) with different Zr—O distances, in agreement with those independently determined by X-ray diffraction. However, the EXAFS study shows that the second oxygen subshell exhibits a Debye–Waller (DW) parameter much higher than that of the first oxygen subshell, a result that cannot be explained by the crystallographic model accepted for the tetragonal phase of zirconia-based materials. However, as proposed by other authors, the difference in the DW parameters between the two oxygen subshells around the Zr atoms can be explained by the existence of oxygen displacements perpendicular to thezdirection; these mainly affect the second oxygen subshell because of the directional character of the EXAFS DW parameter, in contradiction to the crystallographic value. It is also established that this model is similar to another model having three oxygen subshells, with a 4 + 2 + 2 distribution of atoms, with only one DW parameter for all oxygen subshells. Both models are in good agreement with the crystal structure determined by X-ray diffraction experiments.


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