Application of optical spectroscopic techniques in the characterization of elastic strain effects in semiconductor heterostructures and nanostructures and in semiconductor-based thin-film solar cells
Keyword(s):
2002 ◽
Vol 149
(2)
◽
pp. G147
◽
2019 ◽
Vol 450
◽
pp. 262-266
Keyword(s):
Keyword(s):
Keyword(s):