Back Cover: Formation of epitaxial domains: Unified theory and survey of experimental results (Phys. Status Solidi B 4/2011)

2011 ◽  
Vol 248 (4) ◽  
Author(s):  
Marius Grundmann
Keyword(s):  
Experimental Results ◽  
Unified Theory ◽  
Back Cover

A Unified Theory of Cavitation Damage

1963 ◽  
Vol 85 (3) ◽  
pp. 365-373 ◽  
Author(s):  
A. Thiruvengadam
Keyword(s):  
Yield Stress ◽  
Strain Energy ◽  
Functional Relationship ◽  
Present Theory ◽  
Experimental Results ◽  
Unified Theory ◽  
Cavitation Damage ◽  
Dynamic Yield ◽  
Critical Cavitation ◽  
Damage Number

The Cavitation Damage Number proposed by the author has been modified to incorporate the concept of strain-energy instead of the dynamic yield stress of the material. The correlation between the Cavitation Damage Number and the Number of Cavities has been extended to different materials and different sizes. A third nondimensional number known as the Inception of Damage Number has been derived and correlated with the critical cavitation parameter. Detailed investigations in the threshold zone indicate the validity of the functional relationship between the critical cavitation parameter and the Inception of Damage Number. In this paper, the part played by each parameter is analyzed and some of the experimental results arrived at by earlier investigators are explained in the light of the present theory.

scholarly journals Application of Nonredundant Sampling Representations of Electromagnetic Fields to NF-FF Transformation Techniques

2012 ◽  
Vol 2012 ◽  
pp. 1-14 ◽  
Author(s):  
Ovidio M. Bucci ◽  
Claudio Gennarelli
Keyword(s):  
Electromagnetic Fields ◽  
Experimental Results ◽  
Measurement Time ◽  
Optimal Sampling ◽  
Unified Theory ◽  
Transformation Techniques ◽  
Rotational Surface ◽  
Probe Response ◽  
Remarkable Reduction

An overview of the application of the band-limitation properties and nonredundant sampling representations of electromagnetic fields to NF-FF transformations is presented. The progresses achieved by applying them to data acquired on conventional NF scanning surfaces are discussed, outlining the remarkable reduction in the number of needed NF samples and measurement time. An optimal sampling interpolation expansion for reconstructing the probe response on a rotational scanning surface from a non-redundant number of its samples is also discussed. A unified theory of the NF-FF transformations with spiral scannings, which allow a remarkable reduction of the measurement time, is then reviewed by describing a sampling representation of the voltage on a quite arbitrary rotational surface from its nonredundant samples collected on a proper spiral wrapping it. Some numerical and experimental results assessing the effectiveness of the considered NF-FF transformations are shown too.

Diagnostics of Gold Laser Plasmas

1988 ◽  
Vol 102 ◽  
pp. 357-360
Author(s):  
J.C. Gauthier ◽  
J.P. Geindre ◽  
P. Monier ◽  
C. Chenais-Popovics ◽  
N. Tragin ◽  
...  
Keyword(s):  
Experimental Results ◽  
Pure Gold ◽  
Electronic Temperature ◽  
X Ray ◽  
Laser Plasmas ◽  
Collisional Radiative Model ◽  
Radiative Model

AbstractIn order to achieve a nickel-like X ray laser scheme we need a tool to determine the parameters which characterise the high-Z plasma. The aim of this work is to study gold laser plasmas and to compare experimental results to a collisional-radiative model which describes nickel-like ions. The electronic temperature and density are measured by the emission of an aluminium tracer. They are compared to the predictions of the nickel-like model for pure gold. The results show that the density and temperature can be estimated in a pure gold plasma.

Observation of Phase Contrast Images in STEM and CTEM Modes by Using 100 kV Field Emission Electron Gun

1974 ◽  
Vol 32 ◽  
pp. 390-391
Author(s):  
Y. Harada ◽  
T. Goto ◽  
H. Koike ◽  
T. Someya
Keyword(s):  
Field Emission ◽  
Phase Contrast ◽  
Image Formation ◽  
Fresnel Diffraction ◽  
Experimental Results ◽  
Electron Gun ◽  
Scanning Microscopy ◽  
Emission Electron ◽  
Lattice Images

Since phase contrasts of STEM images, that is, Fresnel diffraction fringes or lattice images, manifest themselves in field emission scanning microscopy, the mechanism for image formation in the STEM mode has been investigated and compared with that in CTEM mode, resulting in the theory of reciprocity. It reveals that contrast in STEM images exhibits the same properties as contrast in CTEM images. However, it appears that the validity of the reciprocity theory, especially on the details of phase contrast, has not yet been fully proven by the experiments. In this work, we shall investigate the phase contrast images obtained in both the STEM and CTEM modes of a field emission microscope (100kV), and evaluate the validity of the reciprocity theory by comparing the experimental results.

A new dissociation mode for dislocations in silicon

1978 ◽  
Vol 36 (1) ◽  
pp. 346-347
Author(s):  
A. Ourmazd ◽  
G.R. Booker ◽  
C.J. Humphreys
Keyword(s):  
Detailed Examination ◽  
Experimental Results ◽  
Dislocation Network ◽  
Weak Beam ◽  
Phosphorus Doped

A (111) phosphorus-doped Si specimen, thinned to give a TEM foil of thickness ∼ 150nm, contained a dislocation network lying on the (111) plane. The dislocation lines were along the three <211> directions and their total Burgers vectors,ḇt, were of the type , each dislocation being of edge character. TEM examination under proper weak-beam conditions seemed initially to show the standard contrast behaviour for such dislocations, indicating some dislocation segments were undissociated (contrast A), while other segments were dissociated to give two Shockley partials separated by approximately 6nm (contrast B) . A more detailed examination, however, revealed that some segments exhibited a third and anomalous contrast behaviour (contrast C), interpreted here as being due to a new dissociation not previously reported. Experimental results obtained for a dislocation along [211] with for the six <220> type reflections using (g,5g) weak-beam conditions are summarised in the table below, together with the relevant values.

Multislice calculations of RHEED patterns from vicinal Si (001)

1993 ◽  
Vol 51 ◽  
pp. 1000-1001
Author(s):  
Scott Lordi
Keyword(s):  
Misorientation Angle ◽  
Incident Angle ◽  
Incident Beam ◽  
Experimental Results ◽  
Bragg Condition ◽  
Vicinal Surfaces ◽  
Kinematic Theory ◽  
Step Edges

Vicinal Si (001) surfaces are interesting because they are good substrates for the growth of III-V semiconductors. Spots in RHEED patterns from vicinal surfaces are split due to scattering from ordered step arrays and this splitting can be used to determine the misorientation angle, using kinematic arguments. Kinematic theory is generally regarded to be inadequate for the calculation of RHEED intensities; however, only a few dynamical RHEED simulations have been attempted for vicinal surfaces. The multislice formulation of Cowley and Moodie with a recently developed edge patching method was used to calculate RHEED patterns from vicinal Si (001) surfaces. The calculated patterns are qualitatively similar to published experimental results and the positions of the split spots quantitatively agree with kinematic calculations.RHEED patterns were calculated for unreconstructed (bulk terminated) Si (001) surfaces misoriented towards [110] ,with an energy of 15 keV, at an incident angle of 36.63 mrad ([004] bragg condition), and a beam azimuth of [110] (perpendicular to the step edges) and the incident beam pointed down the step staircase.

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