Catalytic chemical vapour deposition growth of single wall carbon nanotube films on different substrates for transparent electronic devices

2007 ◽  
Vol 244 (11) ◽  
pp. 3935-3938 ◽  
Author(s):  
A. Ansaldo ◽  
V. Skakalova ◽  
E. Di Zitti ◽  
D. Ricci ◽  
S. Roth
Keyword(s):  
Carbon Nanotube ◽  
Chemical Vapour Deposition ◽  
Vapour Deposition ◽  
Electronic Devices ◽  
Chemical Vapour ◽  
Single Wall Carbon Nanotube ◽  
Single Wall Carbon ◽  
Nanotube Films

Control of the single-wall carbon nanotube mean diameter in sulphur promoted aerosol-assisted chemical vapour deposition

Carbon ◽  
2007 ◽  
Vol 45 (1) ◽  
pp. 55-61 ◽  
Author(s):  
A. Barreiro ◽  
C. Kramberger ◽  
M.H. Rümmeli ◽  
A. Grüneis ◽  
D. Grimm ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Chemical Vapour Deposition ◽  
Vapour Deposition ◽  
Chemical Vapour ◽  
Single Wall Carbon Nanotube ◽  
Single Wall Carbon ◽  
Mean Diameter

Structural characterization of randomly and vertically oriented carbon nanotube films grown by chemical vapour deposition

2003 ◽  
Vol 35 (1) ◽  
pp. 15-18 ◽  
Author(s):  
Takashi Ikuno ◽  
Hiroshi Furuta ◽  
Tetsuro Yamamoto ◽  
Syunji Takahashi ◽  
Motoki Kamizono ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Chemical Vapour Deposition ◽  
Structural Characterization ◽  
Vapour Deposition ◽  
Chemical Vapour ◽  
Nanotube Films

Carbon nanotube films obtained by thermal chemical vapour deposition

2001 ◽  
Vol 11 (4) ◽  
pp. 1122-1132 ◽  
Author(s):  
Oleg A. Nerushev ◽  
Martin Sveningsson ◽  
Lena K. L. Falk ◽  
Frank Rohmund
Keyword(s):  
Carbon Nanotube ◽  
Chemical Vapour Deposition ◽  
Vapour Deposition ◽  
Chemical Vapour ◽  
Nanotube Films

Superfluorescent laser sources based on single-wall carbon nanotube films (Conference Presentation)

2017 ◽  
Author(s):  
Zhongqu Long ◽  
Yongrui Wang ◽  
Kankan Cong ◽  
G. Timothy Noe II ◽  
Junichiro Kono ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Single Wall Carbon Nanotube ◽  
Single Wall Carbon ◽  
Laser Sources ◽  
Nanotube Films

scholarly journals Isotropic Seebeck coefficient of aligned single-wall carbon nanotube films

2018 ◽  
Vol 113 (24) ◽  
pp. 243105 ◽  
Author(s):  
Kengo Fukuhara ◽  
Yota Ichinose ◽  
Hiroyuki Nishidome ◽  
Yohei Yomogida ◽  
Fumiya Katsutani ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Seebeck Coefficient ◽  
Single Wall Carbon Nanotube ◽  
Single Wall Carbon ◽  
Nanotube Films

Investigation of the electrocatalytic behavior of single-wall carbon nanotube films on an Au electrode

2002 ◽  
Vol 73 (3) ◽  
pp. 325-333 ◽  
Author(s):  
Jianxiu Wang ◽  
Meixian Li ◽  
Zujin Shi ◽  
Nanqiang Li ◽  
Zhennan Gu
Keyword(s):  
Carbon Nanotube ◽  
Single Wall Carbon Nanotube ◽  
Au Electrode ◽  
Single Wall Carbon ◽  
Nanotube Films

Electrophoretic Deposition of Single Wall Carbon Nanotube Films and Characterization

2014 ◽  
Vol 1752 ◽  
pp. 59-63
Author(s):  
Junyoung Lim ◽  
Maryam Jalali ◽  
Stephen A. Campbell
Keyword(s):  
Carbon Nanotube ◽  
Film Thickness ◽  
Young’S Modulus ◽  
Electrophoretic Deposition ◽  
Flexible Electronics ◽  
Rutherford Backscattering Spectrometry ◽  
Young's Modulus ◽  
Single Wall Carbon Nanotube ◽  
Single Wall Carbon ◽  
Nanotube Films

ABSTRACTElectrophoretic deposition enables the rapid deposition of single wall carbon nanotube films at room temperature. An accurate, reproducible film thickness can be obtained by controlling electric field strength, suspension concentration, and time. To investigate the electrical and mechanical properties of such films, we recorded electric resistance and Young’s modulus using I-V characterization and a nanoindenter, respectively. The measured resistivity of the films varied from 2.14 × 10-3 to 7.66 × 10-3 Ω·cm, and the Young’s modulus was 4.72 to 5.67 GPa, independent of film thickness from 77 to 134 nm. These results indicated that the mechanical and electrical properties of film are comparable with previously reported methods such as layer by layer deposition even though we achieved much higher deposition rates. We also measured the film mass density which is usually unrecorded even though it is an important parameter for MEMS/NEMS device actuation. The film density was found with conventional thickness measurement and Rutherford backscattering spectrometry. It varied from 0.12 to 0.54 g/cm3 as the film thickness increased. This method could be extended to applications of CNT films for flexible electronics or high frequency RF MEMS devices.

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