Phase transitions in ferroelastic lead orthovanadate as observed by means of electron microscopy and electron diffraction. I. Static observations

1980 ◽  
Vol 60 (2) ◽  
pp. 607-617 ◽  
Author(s):  
C. Manolikas ◽  
S. Amelinckx
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Electron Diffraction

scholarly journals Phase transitions in fullerene (C60) and the related microstructure: a study by electron diffraction and electron microscopy

1992 ◽  
Vol 96 (18) ◽  
pp. 7424-7430 ◽  
Author(s):  
G. Van Tendeloo ◽  
C. Van Heurck ◽  
J. Van Landuyt ◽  
S. Amelinckx ◽  
M. A. Verheijen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Electron Diffraction ◽  
Fullerene C60

Electron Microscopic Study of Long Period Modulated Structures with Continuously Variable Periodicity

1983 ◽  
Vol 21 ◽  
Author(s):  
D. Colaitis ◽  
Van Dyck ◽  
C. Conde-Amiano ◽  
S. Amelinckx
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Electron Diffraction ◽  
Microscopic Study ◽  
Electron Microscopic ◽  
Antiphase Boundaries ◽  
Planar Defects ◽  
Long Period ◽  
Modulated Structures ◽  
Reversible Phase

ABSTRACTSome systems show continuous and reversible phase transitions which are characterised by the appearance of irrational sunerlattice reflections with a position that shifts continuously and reversibly with temperature. This diffraction feature is not necessarily caused by a deformation modulation but can also originate from the reneated occurrence of planar defects with a variable “average” periodicity. The planar defects can be of different type (e.g. planes of different composition, antiphase boundaries, twin planes) as shown for the systems Ni3+xTe2, Cu3−xTe2, Cu2−S, mPbS-nBi2S3 ( > 2) and Cu 0.75VS2, using electron-microscopy and electron diffraction.

Phase transitions in In2Se3 as studied by electron microscopy and electron diffraction

1975 ◽  
Vol 30 (1) ◽  
pp. 299-314 ◽  
Author(s):  
J. van Landuyt ◽  
G. van Tendeloo ◽  
S. Amelinckx
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Electron Diffraction

New Design for a Differentially Pumped Hydration Chamber for a Siemens IA

1971 ◽  
Vol 29 ◽  
pp. 44-45
Author(s):  
R. C. Moretz ◽  
G. G. Hausner ◽  
D. F. Parsons
Keyword(s):  
Electron Microscopy ◽  
Water Vapor ◽  
Electron Diffraction ◽  
Water Vapor Pressure ◽  
Biological Materials ◽  
Thin Membrane ◽  
Reliable System ◽  
System A ◽  
Water Films ◽  
Aperture Opening

Electron microscopy and diffraction of biological materials in the hydrated state requires the construction of a chamber in which the water vapor pressure can be maintained at saturation for a given specimen temperature, while minimally affecting the normal vacuum of the remainder of the microscope column. Initial studies with chambers closed by thin membrane windows showed that at the film thicknesses required for electron diffraction at 100 KV the window failure rate was too high to give a reliable system. A single stage, differentially pumped specimen hydration chamber was constructed, consisting of two apertures (70-100μ), which eliminated the necessity of thin membrane windows. This system was used to obtain electron diffraction and electron microscopy of water droplets and thin water films. However, a period of dehydration occurred during initial pumping of the microscope column. Although rehydration occurred within five minutes, biological materials were irreversibly damaged. Another limitation of this system was that the specimen grid was clamped between the apertures, thus limiting the yield of view to the aperture opening.

Studies of Oxide Formation on Copper Thin Films by Electron Microscopy

1977 ◽  
Vol 35 ◽  
pp. 316-317
Author(s):  
G. G. Hembree ◽  
M. A. Otooni ◽  
J. M. Cowley
Keyword(s):  
Electron Microscopy ◽  
Electron Diffraction ◽  
Single Crystal ◽  
Crystal Surface ◽  
Crystal Defects ◽  
Diffraction Reflection ◽  
Reaction Products ◽  
Intermediate Energies ◽  
Crystal Films ◽  
Reflection Electron Microscopy

The formation of oxide structures on single crystal films of metals has been investigated using the REMEDIE system (for Reflection Electron Microscopy and Electron Diffraction at Intermediate Energies) (1). Using this instrument scanning images can be obtained with a 5 to 15keV incident electron beam by collecting either secondary or diffracted electrons from the crystal surface (2). It is particularly suited to studies of the present sort where the surface reactions are strongly related to surface morphology and crystal defects and the growth of reaction products is inhomogeneous and not adequately described in terms of a single parameter. Observation of the samples has also been made by reflection electron diffraction, reflection electron microscopy and replication techniques in a JEM-100B electron microscope.A thin single crystal film of copper, epitaxially grown on NaCl of (100) orientation, was repositioned on a large copper single crystal of (111) orientation.

Electron Microscopy of Graphite Intercalation Compounds

1982 ◽  
Vol 40 ◽  
pp. 544-545
Author(s):  
G. Timp ◽  
L. Salamanca-Riba ◽  
L.W. Hobbs ◽  
G. Dresselhaus ◽  
M.S. Dresselhaus
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Domain Wall ◽  
Intercalation Compounds ◽  
Lattice Plane ◽  
Wall Model ◽  
Graphite Intercalation Compounds ◽  
Fundamental Symmetry ◽  
Graphite Intercalation

Electron microscopy can be used to study structures and phase transitions occurring in graphite intercalations compounds. The fundamental symmetry in graphite intercalation compounds is the staging periodicity whereby each intercalate layer is separated by n graphite layers, n denoting the stage index. The currently accepted model for intercalation proposed by Herold and Daumas assumes that the sample contains equal amounts of intercalant between any two graphite layers and staged regions are confined to domains. Specifically, in a stage 2 compound, the Herold-Daumas domain wall model predicts a pleated lattice plane structure.

Dynamical Scattering in Crystalline Biological Specimens. I. Criteria of Validity for Scattering Approximations

1975 ◽  
Vol 33 ◽  
pp. 192-193
Author(s):  
Robert M. Glaeser ◽  
Bing K. Jap
Keyword(s):  
Biological Sciences ◽  
Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Born Approximation ◽  
Materials Science ◽  
Image Data ◽  
Dynamical Effect ◽  
Crystallographic Structure ◽  
Electron Microscope Image

The dynamical scattering effect, which can be described as the failure of the first Born approximation, is perhaps the most important factor that has prevented the widespread use of electron diffraction intensities for crystallographic structure determination. It would seem to be quite certain that dynamical effects will also interfere with structure analysis based upon electron microscope image data, whenever the dynamical effect seriously perturbs the diffracted wave. While it is normally taken for granted that the dynamical effect must be taken into consideration in materials science applications of electron microscopy, very little attention has been given to this problem in the biological sciences.

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