Study of the electron capture coefficient of substitutional neutral boron atoms in silicon at low temperatures

1973 ◽  
Vol 19 (2) ◽  
pp. 397-403 ◽  
Author(s):  
M. Heckmann ◽  
J. Barrau ◽  
M. Pugnet ◽  
M. Brousseau
Keyword(s):  
Electron Capture ◽  
Low Temperatures ◽  
Capture Coefficient

Effect of Al Composition on the Deep Level Donors of AlxGa1-xSb/lnAs Single Quantum Wells

1992 ◽  
Vol 262 ◽  
Author(s):  
Irai Lo ◽  
W. C. Mitchel ◽  
C. E. Stutz ◽  
K. R. Evans ◽  
M. O. Manasreh
Keyword(s):  
Quantum Wells ◽  
Carrier Concentration ◽  
Electron Capture ◽  
Low Temperatures ◽  
Deep Level ◽  
Time Dependent ◽  
Universal Property ◽  
Persistent Photoconductivity ◽  
Single Quantum ◽  
Deep Donor

ABSTRACTWe have performed Shubnikov-de Haas (SdH) measurements on the AlxGa1-xSb/InAs QW's with x from 0.1 to 1.0 under the negative persistent photoconductivity (NPPC) conditions and confirmed the prediction of Ionized Deep Donor model that the NPPC effect is a universal property for the materials containing ionized deep donors at low temperatures. The time-dependent recombination (electron capture) of the ionized deep donors is similar to that of DX centers. The saturated reduction of carrier concentration in the InAs well increases with increasing x, and rises steeply at about x=0.4. The concentration of deep donors which cause the NPPC in the AlxGa1-xSb/InAs QW's increases with the Al composition.

Monte Carlo study of the statistics of electron capture by shallow donors in silicon at low temperatures

1995 ◽  
Vol 51 (20) ◽  
pp. 14147-14151 ◽  
Author(s):  
A. Palma ◽  
J. A. Jiménez-Tejada ◽  
A. Godoy ◽  
J. A. López-Villanueva ◽  
J. E. Carceller
Keyword(s):  
Monte Carlo ◽  
Electron Capture ◽  
Low Temperatures ◽  
Monte Carlo Study ◽  
Shallow Donors

Electron capture coefficient of neutral indium in silicon

1975 ◽  
Vol 17 (7) ◽  
pp. 787-790 ◽  
Author(s):  
B.O. Sundström ◽  
L. Huldt ◽  
N.G. Nilsson
Keyword(s):  
Electron Capture ◽  
Capture Coefficient

scholarly journals Electron capture dissociation at low temperatures reveals selective dissociations

2004 ◽  
Vol 15 (12) ◽  
pp. 1869-1873 ◽  
Author(s):  
Romulus Mihalca ◽  
Anne J. Kleinnijenhuis ◽  
Liam A. McDonnell ◽  
Albert J. R. Heck ◽  
Ron M. A. Heeren
Keyword(s):  
Electron Capture ◽  
Electron Capture Dissociation ◽  
Low Temperatures
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