The X-Ray laue diffraction near the absorption k-edges of the GaAs lattice atoms

1973 ◽  
Vol 19 (1) ◽  
pp. 319-330 ◽  
Author(s):  
A. N. Gureev ◽  
G. I. Gudzenko ◽  
L. I. Datsenko ◽  
V. B. Molodkin
Keyword(s):  
Laue Diffraction ◽  
X Ray

VHCF damage in duplex stainless steel revealed by microbeam energy-dispersive X-ray Laue diffraction

2021 ◽  
pp. 106358
Author(s):  
Ali Abboud ◽  
Ali AlHassan ◽  
Benjamin Dönges ◽  
Jean Sebastian Micha ◽  
Robert Hartmann ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Duplex Stainless Steel ◽  
Energy Dispersive ◽  
Laue Diffraction ◽  
X Ray

Determining the energy-dependent X-ray flux variation of a synchrotron beamline using Laue diffraction patterns

2011 ◽  
Vol 44 (1) ◽  
pp. 177-183 ◽  
Author(s):  
Catherine Dejoie ◽  
Martin Kunz ◽  
Nobumichi Tamura ◽  
Colin Bousige ◽  
Kai Chen ◽  
...  
Keyword(s):  
Incident Energy ◽  
Flux Variation ◽  
Laue Diffraction ◽  
X Ray ◽  
Measured Flux ◽  
Highly Sensitive ◽  
Diffraction Patterns ◽  
Energy Dependent ◽  
Flux Curve

Although the spectrum originating from a superconducting bending magnet is quasi-continuous, it shows important intensity variations through its spectral range. A method to determine the incident energy-dependent flux variation based on the comparison between observed intensities and the calculated intensities of a well known structure (calcite) is presented here. It is found that the measured flux is highly sensitive to the use of correct Debye–Waller factors for the atoms of the standard crystal. By using the measured flux curve, it was possible to unambiguously index the Laue diffraction pattern of a trigonal crystal structure in its hexagonal setting. This is a crucial but difficult first step for the determination of strain and stress in materials with this symmetry, such as quartz, Mg, Ti, Znetc.

scholarly journals X-ray Laue diffraction from crystals of xylose isomerase.

1988 ◽  
Vol 85 (1) ◽  
pp. 112-115 ◽  
Author(s):  
G. K. Farber ◽  
P. Machin ◽  
S. C. Almo ◽  
G. A. Petsko ◽  
J. Hajdu
Keyword(s):  
Xylose Isomerase ◽  
Laue Diffraction ◽  
X Ray

scholarly journals Laue diffraction as a tool in dynamic studies: hydrolysis of a transiently stable intermediate in catalysis by trypsin

1992 ◽  
Vol 340 (1657) ◽  
pp. 285-300 ◽  
Keyword(s):  
Careful Analysis ◽  
Crystal Quality ◽  
Laue Diffraction ◽  
X Ray ◽  
Multiple Exposures ◽  
Dynamic Studies ◽  
Stable Intermediate ◽  
Structure Determinations ◽  
Ph Jump ◽  
Hydrolysis Of

A transiently stable intermediate in trypsin catalysis, guanidinobenzoyl-Ser-195 trypsin, can be trapped and then released by control of the pH in crystals of the enzyme. This effect has been investigated by static and dynamic white-beam Laue crystallography. Comparison of structures determined before and immediately after a pH jump reveals the nature of concerted changes that accompany activation of the enzyme. Careful analysis of the results of several structure determinations gives information about the reliability of Laue results in general. A study of multiple exposures taken under differing conditions of beam intensity, crystal quality, and temperature revealed information about ways to control damage of specimens by the X-ray beam.

scholarly journals Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined usingIn SituBroadband X-Ray Laue Diffraction

2013 ◽  
Vol 110 (11) ◽  
Author(s):  
A. J. Comley ◽  
B. R. Maddox ◽  
R. E. Rudd ◽  
S. T. Prisbrey ◽  
J. A. Hawreliak ◽  
...  
Keyword(s):  
Single Crystal ◽  
Laue Diffraction ◽  
X Ray

Standard stereographic diagrams and indexing of X-ray Laue diffraction spots of an icosahedral quasicrystal

1994 ◽  
Vol 27 (1) ◽  
pp. 13-19 ◽  
Author(s):  
W. Zhou ◽  
R. Wang ◽  
J. Gui ◽  
J. Zhao ◽  
J. Jiang
Keyword(s):  
Icosahedral Quasicrystal ◽  
Laue Diffraction ◽  
X Ray

Determination of the photoelectron emission probability with inclined X-ray Laue diffraction

1986 ◽  
Vol 42 (1) ◽  
pp. 24-29 ◽  
Author(s):  
A. M. Afanas'ev ◽  
R. M. Imamov ◽  
E. Kh. Mukhamedzhanov ◽  
A. N. Chuzo
Keyword(s):  
Angular Dependence ◽  
Direct Method ◽  
Simple Relation ◽  
Photoelectron Emission ◽  
Laue Diffraction ◽  
X Ray ◽  
Different Depths ◽  
First Time ◽  
A Direct Method

A simple relation has been established between the Fourier component of the probability density P(z) of photoelectron emission from different depths of a crystal and the angular dependence of the emission of photoelectrons formed in inclined X-ray Laue diffraction, which for the first time permitted the use of a direct method for the reconstruction of the P(z) function. Accurate measurements of the angular dependence of photoelectron emission were carried out on a silicon single crystal with diffraction of Cu Kα radiation for different energy ranges. Photoelectrons were recorded by a proportional gas counter specially designed for the energy analysis of photoelectrons under inclined Laue diffraction conditions. The laws predicted by the theory have been fully confirmed, and the corresponding P(z) functions have been obtained.

Elastic strains in polycrystalline UO2 samples implanted with He: micro Laue diffraction measurements and elastic modeling

2013 ◽  
Vol 1514 ◽  
pp. 125-130
Author(s):  
Axel Richard ◽  
Etienne Castelier ◽  
Herve Palancher ◽  
Jean-Sebastien Micha ◽  
Philippe Goudeau
Keyword(s):  
Spent Nuclear Fuel ◽  
Simple Expression ◽  
X Ray Diffraction ◽  
Laue Diffraction ◽  
X Ray ◽  
Elastic Stresses ◽  
Long Term Storage ◽  
Macro Scale ◽  
Grain Orientations

Abstract:In the framework of the study of long-term storage of the spent nuclear fuel, polycrystalline UO2 samples have been implanted with He ions. The thin implanted layer, close to the free surface is subjected to elastic stresses which are studied by x-ray diffraction (micro Laue diffraction) and a mechanical modeling. A simple expression of the displacement gradient tensor has been evidenced; it concerns only three terms (ε3, ε4 and ε5) which strongly evolve with considered grain orientations. Finally, we show that results obtained with micro diffraction are in very good agreement with conventional x-ray diffraction measurements done in laboratory at macro scale.

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