Unvealing GaN Polytypism in Distributed GaN/InAlN Bragg Reflectors Through HRTEM Image Simulation

2018 ◽  
Vol 215 (19) ◽  
pp. 1800218 ◽  
Author(s):  
Lluís López-Conesa ◽  
José Antonio Pérez-Omil ◽  
Žarko Gačević ◽  
Enrique Calleja ◽  
Sònia Estradé ◽  
...  
Keyword(s):  
Bragg Reflectors ◽  
Hrtem Image ◽  
Image Simulation

Comparison and test of HRTEM image simulation programs

1994 ◽  
Vol 55 (4) ◽  
pp. 435-437 ◽  
Author(s):  
D. Van Dyck ◽  
M. Op de Beeck
Keyword(s):  
Hrtem Image ◽  
Image Simulation

Studies of the Structure and Composition of Type-3 Incoherent Zr/ZrN Interfaces by HRTEM, Image Simulation, EFTEM, and NCS Analysis

2004 ◽  
Vol 10 (S02) ◽  
pp. 276-277
Author(s):  
P. Li ◽  
J. M. Howe ◽  
W. T. Reynolds Jr
Keyword(s):  
Hrtem Image ◽  
Image Simulation ◽  
Type 3

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Defect modeling in HRTEM image simulation

1991 ◽  
Vol 49 ◽  
pp. 528-529
Author(s):  
Roar Kilaas
Keyword(s):  
Practical Problem ◽  
Computer Code ◽  
The Other ◽  
Ideal Crystal ◽  
Defect Structures ◽  
Hrtem Image ◽  
Image Simulation ◽  
Transmission Electron ◽  
Atomistic Models ◽  
The Ideal

One practical problem in High Resolution Transmission Electron Microscopy (HRTEM) image simulation is the creation of atomistic models of defect structures. The ideal crystal structures are readily represented by a relatively small number of “basis” atoms and the crystallographic space group. On the other hand, the specification of a grain boundary between two crystals requires the atomic location of possibly thousands of atoms, and a HRTEM simulation program will need all this information before a calculation can be carried out. Users comfortable with writing computer code will write a computer program to generate the hundreds or thousands of atomistic locations, while others may be forced to enter the data by hand or search around for a ready made program that can generate the required data To the authors knowledge, no such suitable program is readily available. There are existing programs that will generate geometric interface models, but these programs were designed to create input to atomistic relaxation calculations, not as generalized tools for creating defect structures.

scholarly journals REW program for the HRTEM image simulation, the alignment and the focus variation image reconstruction

2009 ◽  
Vol 15 (S2) ◽  
pp. 1090-1091 ◽  
Author(s):  
F Lin ◽  
J Weng ◽  
J Chen
Keyword(s):  
Image Reconstruction ◽  
Hrtem Image ◽  
Image Simulation ◽  
Focus Variation

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

scholarly journals Is HRTEM Image Simulation Correct? A Premise-Free Calibration Approach

2016 ◽  
Vol 22 (S3) ◽  
pp. 1390-1391
Author(s):  
Andreas Thust ◽  
Juri Barthel ◽  
Chun-Lin Jia
Keyword(s):  
Hrtem Image ◽  
Image Simulation ◽  
Calibration Approach

New Compositionally-Ordered GeSi Nano Dots Fabricated with 1250 keV Electrons

2007 ◽  
Vol 26-28 ◽  
pp. 1195-1198 ◽  
Author(s):  
Se Ahn Song ◽  
Liudmila I. Fedina ◽  
Hion Suck Baik ◽  
Youn Joong Kim ◽  
Young Min Kim ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Crystal Thickness ◽  
Hrtem Image ◽  
Image Simulation ◽  
Equilibrium Conditions ◽  
Chemical Ordering ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
Point To Point ◽  
First Time

Transformation of uniformly strained GexSi1-x layers into GeSi dots of 3 ~ 7 nm which are compositionally ordered by one or concurrently two sets of {111} planes was carried out for the first time under non-equilibrium conditions induced by 1.25 MeV electron irradiation at Tc ≥ 200 oC in the high voltage electron microscope (JEM-ARM1300S). This microscope installed in the KBSI is characterized by an excellent point-to-point resolution of 0.12 nm allowing obtaining detailed information on chemical ordering at specific parameters of defocus (-800 Å) and crystal thickness (200~250 Å) determined by extensive HRTEM image simulation for the ordered dots.

scholarly journals Shall We Still Consider HRTEM Image Simulation to Interpret Micrographs Obtained Using Cs (and Cc) Corrected Electron Microscopes?

2013 ◽  
Vol 19 (S2) ◽  
pp. 582-583
Author(s):  
P.A. Stadelmann
Keyword(s):  
Hrtem Image ◽  
Image Simulation ◽  
Electron Microscopes

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Advances in image simulation for high-resolution TEM

1995 ◽  
Vol 53 ◽  
pp. 38-39
Author(s):  
Michael A. O'Keefe
Keyword(s):  
High Resolution ◽  
Structure Determination ◽  
Incident Beam ◽  
Hrtem Image ◽  
Image Simulation ◽  
Lattice Image ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Projection Approximation

The original high-resolution transmission electron microscope (HRTEM) image simulation program was written as a tool to confirm interpretation of HRTEM images of niobium oxides. Thorough testing on known structures showed that image simulation could reliably duplicate the imaging process occurring in the HRTEM, and could thus be confidently used to interpret images of unknown structures. Mainstream application of image simulation to routine structure determination by HRTEM was ushered in by the establishment of the wide applicability of the SHRLI (simulated high-resolution lattice image) programs. Structure determination of the mineral takéuchiite by HRTEM and image simulation was the first such determination accepted by the KJCr without x-ray data. Of course, once the reliability of image simulation had been established, it was realized that the technique could be put to work for applications other than structure determination. Early on, simulations were used to explore various HRTEM imaging parameters, including specimen ionicity, validity of the projection approximation, and the resolutionlimiting effects of incident-beam convergence. Since the inception of HRTEM image simulation, its range of uses has continued to expand, and so has the number of programs available; distribution of the SHRLI code spawned improved versions as well as some new programs.

HRTEM Image Simulation of Carbon Nanotubes Under Actual Growth Environment

2004 ◽  
Vol 10 (S03) ◽  
pp. 18-19 ◽  
Author(s):  
S. Takeda ◽  
H. Yoshida
Keyword(s):  
Carbon Nanotubes ◽  
Hrtem Image ◽  
Image Simulation ◽  
Growth Environment ◽  
Materials Research ◽  
Actual Growth ◽  
Free Environment

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

scholarly journals Interpretation of HRTEM images by image simulation: An introduction to theory and practice

1994 ◽  
Vol 52 ◽  
pp. 394-395
Author(s):  
Michael A. O’Keefe
Keyword(s):  
High Resolution ◽  
Niobium Oxide ◽  
Incident Beam ◽  
Wide Distribution ◽  
Theory And Practice ◽  
Hrtem Image ◽  
Image Simulation ◽  
Lattice Image ◽  
Image Code ◽  
Imaging Parameters

High-resolution transmission electron microscope (HRTEM) image simulation was conceived in 1970 in response to a referee's questioning of the interpretation of images of a niobium oxide. Two years later a suite of HRTEM image simulation programs had been established and shown to accurately reproduce experimental HRTEM images when imaging parameters were accurately known. These first simulated images proved that the original interpretation of the niobium oxide images was indeed correct. Once these programs were available, it was possible to explore HRTEM imaging parameters including specimen ionicity, validity of the projection approximation, and the resolution-limiting effects of incident-beam convergence. Over the twenty years since then, the range of uses of HRTEM simulation has continued to expand, as has the number of programs available. World-wide distribution of the SHRLI (simulated high-resolution lattice image) code inspired some researchers to produce new or modified simulation programs and others to compare the results produced by these programs (fig.1).

Sign in / Sign up

Export Citation Format

Share Document