Impact of the AlN nucleation layer on the variation of the vertical-direction breakdown voltage of AlGaN/GaN high-electron-mobility transistor structures on a Si substrate

2017 ◽  
Vol 214 (8) ◽  
pp. 1600843 ◽  
Author(s):  
Yuya Yamaoka ◽  
Ken Kakamu ◽  
Akinori Ubukata ◽  
Yoshiki Yano ◽  
Toshiya Tabuchi ◽  
...  
2008 ◽  
Vol 47 (9) ◽  
pp. 7069-7072 ◽  
Author(s):  
Edward Yi Chang ◽  
Jui-Chien Huang ◽  
Yueh-Chin Lin ◽  
Yen-Chang Hsieh ◽  
Chia-Yuan Chang

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