Back Cover: Kelvin probe force microscopy in the presence of intrinsic local electric fields (Phys. Status Solidi A 4/2011)

2011 ◽  
Vol 208 (4) ◽  
Author(s):  
Christine Baumgart ◽  
Anne-Dorothea Müller ◽  
Falk Müller ◽  
Heidemarie Schmidt
Keyword(s):  
Electric Fields ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Back Cover

scholarly journals Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

2018 ◽  
Vol 9 ◽  
pp. 1809-1819 ◽  
Author(s):  
Amelie Axt ◽  
Ilka M Hermes ◽  
Victor W Bergmann ◽  
Niklas Tausendpfund ◽  
Stefan A L Weber
Keyword(s):  
Thin Film ◽  
Electric Fields ◽  
Cross Sections ◽  
Thin Film Transistors ◽  
Potential Distribution ◽  
Kelvin Probe Force Microscopy ◽  
Reference Structure ◽  
Full Potential ◽  
Kelvin Probe ◽  
Force Microscopy

In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film transistors or on cross sections of functional solar cells. Quantitative surface potential measurements are crucial for understanding the operation principles of functional nanostructures in these electronic devices. Nevertheless, KPFM is prone to certain imaging artifacts, such as crosstalk from topography or stray electric fields. Here, we compare different amplitude modulation (AM) and frequency modulation (FM) KPFM methods on a reference structure consisting of an interdigitated electrode array. This structure mimics the sample geometry in device measurements, e.g., on thin film transistors or on solar cell cross sections. In particular, we investigate how quantitative different KPFM methods can measure a predefined externally applied voltage difference between the electrodes. We found that generally, FM-KPFM methods provide more quantitative results that are less affected by the presence of stray electric fields compared to AM-KPFM methods.

Kelvin probe force microscopy in the presence of intrinsic local electric fields

2011 ◽  
Vol 208 (4) ◽  
pp. 777-789 ◽  
Author(s):  
Christine Baumgart ◽  
Anne-Dorothea Müller ◽  
Falk Müller ◽  
Heidemarie Schmidt
Keyword(s):  
Electric Fields ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

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