Surface characterization of quinhydrone-methanol and iodine-methanol passivated silicon substrates using X-ray photoelectron spectroscopy

2010 ◽  
Vol 208 (1) ◽  
pp. 86-90 ◽  
Author(s):  
Bhumika Chhabra ◽  
Conan Weiland ◽  
Robert L. Opila ◽  
Christiana B. Honsberg
Keyword(s):  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Silicon Substrates ◽  
X Ray ◽  
Passivated Silicon

Surface Characterization of Carbon-Bearing Magnetite (CBM) and Carbon-Bearing Ni(II)-Ferrite (CBNF)

1994 ◽  
Vol 344 ◽  
Author(s):  
T. Sano ◽  
K. Akanuma ◽  
M. Tsuji ◽  
Y. Tamaura
Keyword(s):  
Photoelectron Spectroscopy ◽  
Spinel Structure ◽  
Surface Characterization ◽  
Carbon Deposition ◽  
X Ray Diffraction ◽  
Xps Spectra ◽  
X Ray ◽  
Oxygen Ions ◽  
Diffraction Patterns

AbstractOxygen-deficient magnetite (ODM; Fe3O4-δ, δ>0) synthesized by reduction of magnetite with H2 at 300°C decomposed CO2 to carbon with an efficiency of nearly 100% at 300°C. In this reaction, two oxygen ions of the CO2 were incorporated into the spinel structure of ODM and carbon was deposited on the surface of ODM with zero valence to form visible particles. The particles of carbon separated from ODM were studied by Raman, energy-dispersive X-ray and wave-dispersive X-ray spectroscopies. The carbon which had been deposited on the ODM was found to be a mixture of graphite and amorphous carbon in at least two levels of crystallization. X-ray photoelectron spectroscopy and X-ray diffraction patterns of the carbon-bearing magnetite (CBM) showed no indication of carbide (Fe3C) or metallic iron (α-Fe) phase formation. In the C 1s XPS spectra of the CBM, no peaks were observed which could be assigned to CO2 or CO. X-ray diffractometry, chemical analysis and TG-MS measurement showed that the carbon-bearing Ni(II)-ferrite (CBNF) (Ni(II)/Fetotal = 0.15) synthesized by the carbon deposition reaction from CO2 with the H2-reduced Ni(II)-ferrite was represented by (Ni0.28Fe2.72O4.00)1-δ (Ni2+06.9Fe2+2.31O3.00)δCτ (δ= 0.27, τ= 0.17). The carbon of the CBNF gave the CIOlayer-like oxide containing some Ni2+ ions.

Surface characterization of the high voltage LiCoO2/Li cell by X-ray photoelectron spectroscopy and 2D correlation analysis

2010 ◽  
Vol 53 (1) ◽  
pp. 60-63 ◽  
Author(s):  
Yeonju Park ◽  
Nam Hoon Kim ◽  
Ja Young Kim ◽  
In-Yong Eom ◽  
Yeon Uk Jeong ◽  
...  
Keyword(s):  
Correlation Analysis ◽  
High Voltage ◽  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
X Ray ◽  
2D Correlation Analysis

Surface Characterization of an Extruded 6060 Al Alloy

2007 ◽  
Vol 29-30 ◽  
pp. 67-70
Author(s):  
Wei Zhang ◽  
Jim Metson ◽  
C.L. Nguyen ◽  
S. Chen
Keyword(s):  
Aluminium Alloy ◽  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Extrusion Direction ◽  
Surface Characteristics ◽  
Al Alloy ◽  
X Ray ◽  
Film Instability ◽  
Mg Content

The surface characteristics of an extruded 6060 aluminium alloy were investigated with X-ray Photoelectron Spectroscopy (XPS). The results revealed that the extruded surface was covered by oxides of aluminium and magnesium. The thickness of aluminium oxide was found to change along the extrusion direction with the thinnest and thickest oxide at the beginning and end of the extrudate, respectively. Magnesium segregation was found on the surface of the extrusion with the highest and lowest Mg concentration at the beginning and end of the extrudate, respectively. This is the inverse result of that expected where increasing Mg content was believed to be associated with film instability and thicker films.

Surface characterization of colloidal polypyrrole particles synthesized with reactive steric stabilizers using X-ray photoelectron spectroscopy

Polymer ◽  
1996 ◽  
Vol 37 (13) ◽  
pp. 2743-2749 ◽  
Author(s):  
M.R. Simmons ◽  
P.A. Chaloner ◽  
S.P. Armes ◽  
E.T. Kang ◽  
K.L. Tan ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
X Ray

Characterization of Rapid Nitrided Ultrathin SiO2 Films By XPS and SCS

1995 ◽  
Vol 387 ◽  
Author(s):  
H. Yan ◽  
S. P. Wong ◽  
R. W. M. Chan ◽  
R. W. M. Kwok ◽  
W. X. Feng
Keyword(s):  
Photoelectron Spectroscopy ◽  
Interface State ◽  
Dielectric Surface ◽  
State Density ◽  
Breakdown Field ◽  
Silicon Substrates ◽  
X Ray ◽  
Dielectric Layers ◽  
Breakdown Field Strength

AbstractUltrathin SiO2 dielectric layers of thickness less than 100Å on silicon substrates have been prepared by dry oxidation and rapid thermal nitirdation (RTN). In this study, X-ray photoelectron spectroscopy and surface charge spectroscopy had been applied to study the nitrogen distribution in the dielectric layers and the change in the interface state density (Dit) due to the nitrogen incorporation. It is found that most of the incorporated nitrogen is located near the dielectric/Si interface and the nitrogen content increases with the RTN temperature. For the electrical properties, we found that the Dit, after RTN slightly decreases and the breakdown field strength deduced from the dielectric surface potential was enhanced by the incorporation of nitrogen.

Surface Characterization of Electrochemically Fabricated CuO Doped ZnO Thin Film

2005 ◽  
Vol 277-279 ◽  
pp. 972-976
Author(s):  
Jang Hee Yoon ◽  
Yoon Bo Shim ◽  
Chae Ryong Cho ◽  
Mi Sook Won
Keyword(s):  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Reference Electrode ◽  
Cathodic Current ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Zn Concentration ◽  
Solution Doping

In this study, ZnO and CuO doped zinc oxide thin films were cathodically deposited in aqueous zinc chloride solutions in the presence of oxygen on a Pt/Ti/SiO2/Si substrate through an electrochemical reaction. A mercurous sulfate electrode was used as a reference electrode and the counter electrode was a Pt spiral wire. Deposition was carried out in solutions containing Zn2+ ions introduced as ZnCl2 salt at concentrations ranging from 5.0 x 10-4 to 5.0 x 10-2 M. The bath temperatures were controlled from 65°C to 80°C. The oxygen gas was introduced from argon/oxygen mixtures allowing its partial pressure to be fixed along with its concentration in the solution. Doping of CuO was carried out in cupric nitrate or a cupric chloride/0.1M KCl solution. The influence of the Cu/Zn concentration, deposition temperature of a solution, applied cathodic potential and deposition time were optimized. After the potential was applied, the cathodic current reached a steady state within 5 min. The composition, and the characterization of the surface of the films were investigated through X-ray diffractometry, X-ray photoelectron spectroscopy, atomic force microscopy and scanning electron microscopy.

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